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Microdots as a Means of Marking and Tracking Artifacts

Published online by Cambridge University Press:  26 February 2011

Dale O. Butterfield  and
Pamela Vandiver
Dale O. Butterfield
Affiliation:
Alpha-Dot Technologies, Inc., So. 104 Freya, Spokane, WA 99202
Pamela Vandiver
Affiliation:
Conservation Analytical Laboratory, Smithsonian Institution, Washington, D.C. 20560
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Abstract

Scanning electron microscopy with simultaneous energy dispersive x-ray analysis was used to characterize microdots to assess their suitability for the identification and trackingof artifacts. They were found comparable to commercial state-of-theart microfilm and microfiche which are known to be durable for about 20 years without postprocessing treatment to stabilize them.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 352: Symposium – Materials Issues in Art and Archaeology IV , 1995 , 181
Copyright
Copyright © Materials Research Society 1995

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