Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-19T04:36:14.818Z Has data issue: false hasContentIssue false

Mg-doped N-polar InN Grown by RF-MBE

Published online by Cambridge University Press:  01 February 2011

Daisuke Muto
Affiliation:
[email protected], Ritsumeikan Univ., Department of Photonics, 1-1-1 Noji-Higashi, Kusatsu, 525-8577, Japan, +81-77-561-2884, +81-77-561-3994
Hiroyuki Naoi
Affiliation:
[email protected], Ritsumeikan Univ., Center for Promotion of the COE Program, 1-1-1 Noji-Higashi, Kusatsu, 525-8577, Japan
Shinya Takado
Affiliation:
[email protected], Ritsumeikan Univ., Department of Photonics, 1-1-1 Noji-Higashi, Kusatsu, 525-8577, Japan
Hyunseok Na
Affiliation:
[email protected], Ritsumeikan Univ., Center for Promotion of the COE Program, 1-1-1 Noji-Higashi, Kusatsu, 525-8577, Japan
Tsutomu Araki
Affiliation:
[email protected], Ritsumeikan Univ., Department of Photonics, 1-1-1 Noji-Higashi, Kusatsu, 525-8577, Japan
Yasushi Nanishi
Affiliation:
[email protected], Ritsumeikan Univ., Department of Photonics, 1-1-1 Noji-Higashi, Kusatsu, 525-8577, Japan
Get access

Abstract

We have investigated the growth properties of Mg-doped N-polar InN films grown by radio-frequency plasma-assisted molecular beam epitaxy (RF-MBE). We found that the Mg-doped InN films had smaller grain size than non-doped films, and furthermore the grain size decreased with an increase in Mg doping amount. Non-doped InN exhibited a single X-ray diffraction (XRD) peak of (0002) h-InN. On the other hand, the Mg-doped InN produced a weak XRD peak of (111) c-InN in addition to a strong peak of (0002) h-InN. These results indicate that the Mg doping decreased the surface migration length of In atoms. From Hall-effect measurements, all the samples were shown to have n-type conductivity. Mg-doped InN grown with Mg cell temperatures of 130 and 135°C had carrier concentrations that were about half (i.e., ∼4.5×1018 cm−3) that of the non-doped InN. However, the carrier concentration tended to increase with further supply of Mg. These results indicate that Mg-doping causes a trade-off between a carrier decreasing effect from the Mg acceptors and a carrier increasing effect from defects caused by the poor surface migration of In atoms.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Davydov, V. Yu., Klochikhin, A. A., Seisyan, R. P., Emtsev, V. V., Ivanov, S. V., Bechstedt, F., Furthmüller, J., Harima, H., Mudryi, A. V., Aderhold, J., Semchinova, O., and Graul, J., phys. stat. sol. (b) 229, R1 (2002).Google Scholar
2. Wu, J., Walukiewicz, W., Yu, K. M., Arger III, J. W., Haller, E. E., Lu, H., Schaff, W. J., Saito, Y., and Nanishi, Y., Appl. Phys. Lett. 80, 3967 (2002).Google Scholar
3. Matsuoka, T., Okamoto, H., Nakao, M., Harima, H., and Kurimoto, E., Appl. Phys. Lett. 81, 1246 (2002).Google Scholar
4. Lu, H., Schaff, W. J., Eastman, L. F., and Stutz, C. E., Appl. Phys. Lett. 82, 1736 (2003).Google Scholar
5. Mahboob, I., Veal, T. D., McConville, C. F., Lu, H., and Schaff, W. J., Phys. Rev. Lett. 92, 036804 (2004).Google Scholar
6. Li, S. X., Yu, K. M., Wu, J., Jones, R. E., Walukiewicz, W., Ager III, J. W., Shan, W., Haller, E. E., Lu, H., and Schaff, W. J., Phys. Rev. B 71, 161201 (2005).Google Scholar
7. Jones, R. E., Yu, K. M., Li, S. X., Walukiewicz, W., Ager, J. W., Haller, E. E., Lu, H., and Schaff, W. J., Phys. Rev. Lett. 96, 125505 (2006).Google Scholar
8. Mamutin, V. V., Vekshin, V. A., Davydov, V. Yu., Ratnikov, V. V., Kudriavtsev, Yu. A., Ber, B. Ya., Emtsev, V. V., and Ivanov, S. V., phys. stat. sol. (a) 176, 373 (1999).Google Scholar
9. Li, L. K., Jurkovic, M. J., Wang, W. I., Van Hove, J. M., and Chow, P. P., Appl. Phys. Lett. 76, 1740 (2000).Google Scholar