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A method for in-situ measurements of the growth in the bulk of deformed single crystals at the 3DXRD microscope
Published online by Cambridge University Press: 15 March 2011
Abstract
With the Three Dimensional X-ray Diffraction microscope (3DXRD) located at the European Synchrotron Radiation Facility (ESRF) full 3D spatial information of grains in the interior of a sample can be measured non-destructively. In this paper we discuss the possibility of an extension to this scenario, namely in-situ annealing studies, where the 3D spatial grain shape can be monitored as function of time. Consequently, local boundary migration rates can be estimated and compared to the deformed microstructure. Such information may reveal to what extend the deformed microstructure influences the growth of a grain during recrystallization.
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- Copyright © Materials Research Society 2004