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Mesoscopic characterization of the optical property of antiphase boundaries in CuPt-ordered GaInP2

Published online by Cambridge University Press:  10 February 2011

Y. Ohno
Affiliation:
Department of Physics, Graduate School of Science, Osaka University, 1–16, Machikane-yama, Toyonaka, Osaka 560–0043, Japan
S. Takeda
Affiliation:
Department of Physics, Graduate School of Science, Osaka University, 1–16, Machikane-yama, Toyonaka, Osaka 560–0043, Japan
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Abstract

We have developed an apparatus for polarized cathodoluminescence (CL) spectroscopy combined with transmission electron microscopy (TEM), that enables us to obtain simultaneously structural data in higher spatial resolution by TEM and polarized luminescence spectra by CL of the same microscopic area. The polarized-CL/TEM method is very useful to study the optical properties of low-dimensional microstructures in semiconducting materials. We have applied the method to examine the optical property of antiphase boundaries in CuPt-ordered GaInP2 and found, for the first time, the polarized light emission from the APBs whose habit planes are parallel to the (T11) and (1T0) atomic planes.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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References

[1] Petroff, P. M. and Logan, L. A., J. Vac. Sci. & Technol. 17, 1113(1980).Google Scholar
[2] Pennycook, S., Brown, L. M., and Craven, A. J., Philos. Mag., A41, 589 (1980).Google Scholar
[3] Steeds, J. W., Colloq. Phys. C 6, 65(1989).Google Scholar
[4] Yamamoto, N., Mater. Trans. JIM 31, 659(1990).Google Scholar
[5] Ohno, Y. and Takeda, S., submitted for publication (1999).Google Scholar
[6] Su, L. C., Ho, I. H., and Stringfellow, G. B., J. Appl. Phys. 75, 5135; 76, 3520 (1994).Google Scholar
[7] Gregor, M. J., Blome, P. G., Ulbrich, R. G., Grossmann, P., Grosse, S., Feldmann, J., Stolz, W., Gobel, E. O., Arent, D. J., Bode, M., Bertness, K. A., and Olson, J. M., Appl. Phys. Lett. 67, 3572(1995).Google Scholar
[8] Smith, S., Cheong, H. M., Fluegel, B. D., Geisz, J. F., Olson, J. M., Kazmerski, L. L., and Mascarenhas, A., Appl. Phys. Lett. 74, 706(1999).Google Scholar
[9] Cheong, H. M., Mascarenhas, A., Geisz, J. F., Olson, J. M., Keller, M. W., and Wendt, J. R., Phys. Rev. B 57, R9400 (1998).Google Scholar
[10] Kops, U., Ulbrich, R. G., Burkard, B., Geng, C., Scholz, F., and Schweizer, M., Phys. Stat. Sol. (a) 164, 459(1997).Google Scholar
[11] Nasi, L., Salviati, G., Mazzer, M., and Fregonara, C. Z., Appl. Phys. Lett. 68, 3263(1996).Google Scholar
[12] Mattila, T., Wei, S. H., and Zunger, A., Phys. Rev. Lett. 83, 2010(1999).Google Scholar
[13] Ohno, Y. and Takeda, S., Rev. Sci. Instr. 66, 4866(1995).Google Scholar
[14] Davidson, S. M., J. Microsc. 110, 177(1977).Google Scholar
[15] Noda, N. and Takeda, S., Phys. Rev. B 53, 7197(1996).Google Scholar
[16] Ohno, Y., Kawai, Y., and Takeda, S., Phys. Rev. B 59, 2694(1999).Google Scholar
[17] The density of the APBs on a (hkl) plane was evaluated as the length of the APB lines perpendicular to the [hkl] direction in a unit area in a TEM image.Google Scholar
[18] Liu, N., Shih, C. K., Geisz, J., Mascarenhas, A., and Olson, J. M., Appl. Phys. Lett. 73, 1979(1998).Google Scholar