Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-29T07:46:34.211Z Has data issue: false hasContentIssue false

Measurements of Strain Induced Resistivity by the Eddy-Current Decay Method

Published online by Cambridge University Press:  21 February 2011

K. Theodore Hartwig*
Affiliation:
Texas A&M University, Department of Mechanical Engineering, College Station, TX 77843-3123.
Get access

Abstract

The eddy-current decay method developed by Bean for electrical resistivity measurements is well-suited for bulk metal characterization studies. The technique can be applied to investigations of low temperature plastic strain in pure aluminum.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Fickett, F.R., in Materials at Low Temperatures, edited by Reed, R.P. and Clark, A.F. (ASM, Metals Park, Ohio, 1983), p. 165.Google Scholar
2. Bean, C.P., J. Appl. Phy. 30(12), 1976 (1959).CrossRefGoogle Scholar
3. Clark, A.F., Deacon, V.A., Hust, J.G. and Powell, R.L., Standard Reference Materials: The Eddy-Current Decay Method for Resistivity Characterization of High Purity Metals, NBS Special Publication 260–39 (U.S. Dept. of Commerce, Nat. Bur. Standards, 1972).Google Scholar
4. Hartwig, K.T., in Eddy-Current Characterization of Materials and Structures, STP 722, edited by Birnbaum, G. and Free, G. (ASTM Publishers, Philadelphia, 1981), p. 157.CrossRefGoogle Scholar
5. Hartwig, K.T. and Yuan, G.S., in Cryogenic Materials '88, Volume 2, Structural Materials, edited by Reed, R.P., Xing, Z.S. and Collings, E.W., (ICMC, Boulder, CO, 1988), p. 677.Google Scholar