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Measurements of Strain Induced Resistivity by the Eddy-Current Decay Method
Published online by Cambridge University Press: 21 February 2011
Abstract
The eddy-current decay method developed by Bean for electrical resistivity measurements is well-suited for bulk metal characterization studies. The technique can be applied to investigations of low temperature plastic strain in pure aluminum.
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- Research Article
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- Copyright © Materials Research Society 1989
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