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Measurement of Young's Modulus and Poisson's Ratio of Free-Standing Ag/Cu Multilayered Thin Films
Published online by Cambridge University Press: 15 February 2011
Abstract
Strain measurement by laser diffraction was used in tensile testing of free-standing Ag/Cu multilayered thin films with repeat lengths between 3 nm and 3 μm. The mean value, for all the films, of the Young modulus was 83.1± 1.2 GPa, and of the Poisson ratio was 0.377±0.015. No variation with bilayer repeat length, and hence no “supermodulus” effect, was observed.
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- Copyright © Materials Research Society 1996
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