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Measurement of the Relative Position of Adjacent Crystals and the Modelling of Interfacial Structure

Published online by Cambridge University Press:  25 February 2011

M.H.I. El-Eraki ,
C.J. Kiely  and
R.C. Pond
M.H.I. El-Eraki
Affiliation:
Department of Materials Science and Engineering, The University of Liverpool, P.O. Box 147, Liverpool L69 3BX, U.K.
C.J. Kiely
Affiliation:
Department of Materials Science and Engineering, The University of Liverpool, P.O. Box 147, Liverpool L69 3BX, U.K.
R.C. Pond
Affiliation:
Department of Materials Science and Engineering, The University of Liverpool, P.O. Box 147, Liverpool L69 3BX, U.K.
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Abstract

Various techniques using transmission electron microscopy for determining the relative position of two crystals separated by an interface are reviewed briefly. Measurements obtained by these means can be used to identify unrelaxed interfacial configurations. The modelling of relaxed configurations based on these unrelaxed candidate structures requires additional information from experimental techniques such as electron diffraction and high resolution microscopy, or theoretical investigation by computer simulation. This procedure is illustrated for a selection of grain and interphase boundaries. {211} grain boundaries between twin related crystals of Al and Ge, and interfaces in NiSi2:Si, CoSi2:Si and AI:GaAs epitaxial systems, are discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 159: Symposium C – Atomic Scale Structure of Interfaces , 1989 , 77
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1. Pond, R.C. and Smith, D.A., Canad. Metall. Q. 13, 33 (1974).Google Scholar
2. Pond, R.C., J. Micros. 116, 105 (1979).Google Scholar
3. Pond, R.C. and Vitek, V., Proc. R. Soc. Lond. A357, 453 (1977).Google Scholar
4. Pond, R.C., Proc. R. Soc. Lond. A357, 471 (1977).Google Scholar
5. Vlachavas, D. and Pond, R.C., Inst. Phys. Conf. Ser. No. 60, 159 (1981).Google Scholar
6. Fontaine, C. and Smith, D.A., Appl. Phys. Lett. 40, 153 (1982).Google Scholar
7. Papon, A.M. and Petit, M., Scripta Met. 19 391 (1985).Google Scholar
8. Rocher, A. and Labidi, M., Revue Phys. Appl. 21, 201 (1986).Google Scholar
9. Komninou, Ph., Karakostas, Th. and Delavignette, P., J. Mat. Sd. 21, 3817 (1980).Google Scholar
10. Papon, A.M., Petit, M. and Bacmann, J.J., Phil. Mag. A49, 573 (1984).Google Scholar
11. Bacmann, J.J., Papon, A.M., Petit, M. and Silvestre, G., Phil. Mag. A51,697 (1985).Google Scholar
12. Matthews, J.W. and Stobbs, W.M., Phil. Mag. A36, 373 (1977).Google Scholar
13. Wood, G.J., Stobbs, W.M. and Smith, D.J., Phil. Mag. A50, 375 (1984).Google Scholar
14. Boothroyd, C.B., Crawley, A.P. and Stobbs, W.M., Phil. Mag. A54, 663 (1986).Google Scholar
15. Gibson, J.M., Ultramicroscopy 14, 11, (1984).Google Scholar
16. Eaglesham, D.J., Kiely, C.J., Cherns, D. and Missous, M., Phil. Mag. A60, 161 (1989).Google Scholar
17. Cherns, D., Kiely, C.J. and Eaglesham, D.J., Proc. Mat. Res. Soc. Symp., 75 321 (1985).Google Scholar
18. Schapink, F.W. and Mertens, F.J.M., Scripta Met. 15, 611 (1981).Google Scholar
19. Caron, R.P. and Schapink, F.W., Ultramicroscopy, 17, 383 (1985).Google Scholar
20. Schapink, F.W., Forghany, S.K.E. and Buxton, B.F., Acta Cryst. A39, 805 (1983).Google Scholar
21. Schapink, F.W., Forghany, S.K.E. and Caron, R.P., Phil. Mag. A53, 717 1986.Google Scholar
22. El-Eraki, M.H.I., Ph.D. Thesis, University of Liverpool (1989).Google Scholar
23. Pond, R.C., in Dislocations in Solids, Vol. 8, edited by Nabarro, F.R.N. (North-Holland, Anmsterdam, 1989) p.1.Google Scholar
24. Bollmann, W., Crystal Defects and Crystalline Interfaces (Springer-Verlag, Berlin, 1970).Google Scholar
25. Pond, R.C., in Grain Boundary Structure and Kinetics, edited by Balluffi, R.W. (ASM, Columbus 1980).Google Scholar
26. Sun, C.P. and Balluffi, R.W., Phi. Mag. A46, 63 (1982).Google Scholar
27. Pond, R.C., Bacon, D.J., Serra, A. and Sutton, A.P., accepted for publication in Metall. Trans. (1990).Google Scholar
28. Bourret, A. and Bacmann, J.J., Inst. Phys. Conf. Ser. No. 78, 337 (1985).Google Scholar
29. Bourret, A., Billard, L. and Petit, M., Inst. Phys. Conf. Ser. No. 76, 23 (1985).Google Scholar
30. Cheikh, M., Hairie, A., Hairie, F., Nouet, G. and Paumier, E., accepted for publication in J. Phys. Colloq. (1990).Google Scholar
31. Bourret, A. and Bacmann, J.J., Proc. J.I.M.I.S. 4, Minakami Spu (1985).Google Scholar
32. Paxton, A.T. and Sutton, A.P., J. Phys. C 21 L481 (1988).Google Scholar
33. Cherns, D., Anstis, G.R., Hutchison, J.L. and Spence, J.C.H., Phil. Mag. A 46, 849 (1982).Google Scholar
34. Batstone, J.L., Gibson, J.M., Tung, R.T. and Loretto, D., EMSA Proceedings, (1989).Google Scholar
35. Loretto, D., Gibson, J.M., White, A.E., Short, K.T., Tung, R.T., Yahsave, S.M. and Batstone, J.L., Appl. Phys. Letts. - in press (1989).Google Scholar
36. Kiely, C.J. and Cherns, D., Phil. Mag. A. 59 (1), 1, (1989).Google Scholar