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Mass Spectrometry Analysis of Organic-Inorganic Nanomaterials and their Precursors

Published online by Cambridge University Press:  01 February 2011

Jean-Jacques Gaumet  and
Geoffrey Strouse
Jean-Jacques Gaumet
Affiliation:
LSMCL, Metz University, IPEM, Technopôle 2000, 57078 Metz Cedex 03, FRANCE
Geoffrey Strouse
Affiliation:
UCSB, Department of Chemistry, Santa Barbara, CA 93106-9510, U.S.A.
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Abstract

We report in this paper how electrospray mass spectrometry (ESMS) and nanospray mass spectrometry (NMS) are promising for analyzing precursors and nano-scale semiconductor (IIVI) materials up to 1.5 nm and mixed valence clusters (Co/Cd). We show that both ion modes in ESMS and NMS provide insight concerning the structure analysis, the composition and the stability of these materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 726: Symposium Q – Hybrid Organic-Inorganic Materials , 2002 , Q10.6
Copyright
Copyright © Materials Research Society 2002

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