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Mapping Residual-Stress Distributions in a Laser-Peened Vit-105 Bulk-Metallic Glass Using the Focused-Ion-Beam Micro-Slitting Method

Published online by Cambridge University Press:  11 March 2011

B. Winiarski ,
G. Wang ,
X. Xie ,
Y. Cao ,
Y. Shin ,
P. K. Liaw  and
P. J. Withers
B. Winiarski
Affiliation:
School of Materials, The University of Manchester, Grosvenor St., Manchester, M1 7HS, UK
G. Wang
Affiliation:
Dept. of Materials Sci. & Eng., The University of Tennessee, Knoxville, TN 37996, USA
X. Xie
Affiliation:
Dept. of Materials Sci. & Eng., The University of Tennessee, Knoxville, TN 37996, USA
Y. Cao
Affiliation:
School of Mechanical Engineering, Purdue University, West Lafayette, IN 47907, USA
Y. Shin
Affiliation:
School of Mechanical Engineering, Purdue University, West Lafayette, IN 47907, USA
P. K. Liaw
Affiliation:
Dept. of Materials Sci. & Eng., The University of Tennessee, Knoxville, TN 37996, USA
P. J. Withers
Affiliation:
School of Materials, The University of Manchester, Grosvenor St., Manchester, M1 7HS, UK
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Abstract

Measuring residual-stresses at the micron scale in glassy materials imposes experimental challenges, particularly when using diffraction, or other conventional laboratory methods, e.g., optical non-contact methods, grid methods, etc. In this short paper, a technique for mapping residual-stress profiles in amorphous materials with high spatial definition is used to measure residual-stresses in a laser-peened and fatigued bulk-metallic glass - Vit-105. The method involves local deposition of nano Pt dots patterns on the mapped region of the specimen and milling of a series of micro-slots of size 15 × 2 × 0.4 μm3 using the focused ion beam of a dual beam Field Emission Gun Scanning Electron Microscope / Focused Ion Gun (FEGSEM/FIB) instrument. The deformation fields in the vicinity of slots are reconstructed by the digital image correlation analyses (DICA) of FEGSEM images recorded during milling. The residual-stresses are inferred by fitting a reference displacement field obtained from finite-element analyses (FEA) with the recorded displacement field. In this way, residual-stress distributions have been characterized as a function of the distance from the laser-peened surface to a depth of 1,200 microns with a spatial resolution of 30 μm. The influence of fatigue loading on the compressive residual-stresses spatial distribution is studied and discussed. It was found that the fatigue loading significantly changes the compressive residual-stress spatial distribution in the laser-peened layer.

Keywords

shock loadingion-beam processingscanning electron microscopy (SEM)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1300: Symposium U – Bulk Metallic Glasses and their Applications , 2011 , mrsf10-1300-u09-10
Copyright
Copyright © Materials Research Society 2011

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References

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