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Magnetotransport in Thin Films of Lan-nxCa1+nxMnnO3n+1 (n=2,3, and ∞)

Published online by Cambridge University Press:  10 February 2011

H. Asano ,
J. Hayakawa  and
M. Matsui
H. Asano
Affiliation:
Dept. of Crystalline Materials Science, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464–01, Japan, [email protected]
J. Hayakawa
Affiliation:
Dept. of Crystalline Materials Science, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464–01, Japan, [email protected]
M. Matsui
Affiliation:
Dept. of Crystalline Materials Science, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464–01, Japan, [email protected]
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Abstract

With a use of the epitaxial a-axis thin films of perovskite series Lan-nxCa1+nxMnnO3n+1 (n=2,3, and ∞) with fixed carrier concentration (x=0.3), the transport properties of the series compounds have been examined to be associated with the difference in the number of the MnO2 layers. Results have indicated that a reduction in the number of layers results in systematic changes in the various features. These include an increase in resistivity, a decrease in resistivity peak temperature Tcρ corresponding to the metal-insulator transition, an enhancement of the maximum MR near Tcρ, and an increase in low temperature intrinsic MR. In order to explain the variation in these features with the number of MnO2 layers, it is necessary to take both anisotropie c-axis transfer interaction and two-dimensional spin fluctuation into account.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 494: Symposium V – Science & Technology of Magnetic Oxides , 1997 , 131
Copyright
Copyright © Materials Research Society 1998

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References

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