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Published online by Cambridge University Press: 10 February 2011
We report studies on La1−xSrxMnO3 /SrTiO3/ La1−xSrxMnO3 (x=0.33) trilayer junctions made using 90° off-axis sputtering. Both (110) NdGaO3 and (001) (LaAlO3)0.3-(Sr2AlTaO6)0.7 (LSAT) are used for substrates. Optical lithography is used for junction formation. These sputtered trilayers show improved junction resistance uniformity over trilayers made using laser ablation. A magnetoresistance of ∼100% is observed for junctions on LSAT with 30 Å barrier at 13 K and around 100 Oe. The shape of junction magnetoresistance vs. field depends both on barrier thickness and on substrate type, suggesting that both inter-layer coupling and substrateinduced-strain play a role in determining the junction's micromagnetic state. These results indicate better junction interfaces can be obtained for manganite trilayer junctions by 90° off-axis sputtering.