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Magneto-Optical Study of Negative Persistent Photo-Effect in InAs/Alo.5Ga0.5Sb Quantum Wells

Published online by Cambridge University Press:  21 February 2011

J.-P. Cheng
Affiliation:
Francis Bitter National Magnet Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
Ikai Lo
Affiliation:
WL/MLPO, Wright Laboratory, Wright-Patterson Air Force Base, Ohio 45433-6533 Department of Physics, National Sun Yat-Sen University, Kaohsiung, Taiwan, R.O.C.
W.C. Mitchel
Affiliation:
WL/MLPO, Wright Laboratory, Wright-Patterson Air Force Base, Ohio 45433-6533
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Abstract

Cyclotron resonance (CR) of electrons confined in an InAsZAlo.5Gao.5Sb quantum well has been used to investigate the negative persistent photo-effect (NPP) at low temperatures. After an in situ cross-gap light illumination, the electron density is reduced 28%, and the CR effective mass decreases from (0.0342±0.0002)mo to (0.0322±0.0002)mo. The response time of the NPP build-up transient has been studied via the photon-dose technique, and it is on the order of 10 msec with an illumination power flux of ~ 10mW/cm2.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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References

1 See, e.g., Munekata, H., Esaki, L., and Chang, L.L., J. Vac. Sci. Technol. B5, 806 (1987).Google Scholar
2 Tuttle, G., Kroemer, H., and English, J.H., J. Appl. Phys. 65, 5239 (1989); P.F. Hopkims, A.J. Rimberg, R.M. Westervelt, G. Tuttle, and H. Kroemer, Appl. Phys. Lett. 1428 (1991).Google Scholar
3 See, e.g., Nelson, R.J., Appl. Phys. Lett. 31, 351 (1977); K. Khachaturyan et al., Phys. Rev. B 40, 6304 (1989); H.X. Jiang and J.Y. Lin, Phys. Rev. Lett. 64, 2547 (1990); A.S. Dissanayake et al., Phys. Rev. B 48, 8145 (1993).Google Scholar
4 Morgan, T.N., Phys. Rev. B 34, 2664 (1986); D.J. Chadi and K.J. Chang, Phys. Rev. Lett. 57, 873 (1988).Google Scholar
5 Lang, D.V. and Logan, R.A., Phys. Rev. Lett. 39, 635 (1977); D.V. Lang, R.A. Logan, and M. Jaros, Phys. Rev. B 19, 1015 (1979).Google Scholar
6 Ikai, Lo, Mitchel, W.C., Manasreh, M.O., Stutz, C.E., and Evans, K.R., Appl. Phys. Lett. 60, 751 (1992); Ikai Lo, W.C. Mitchel, C.E. Stutz, and M.Y. Yen, Proc. of Mat. Res. Soc. 1992 Fall Meeting, Boston.Google Scholar
7 Scriba, J., Seitz, S., Wixforth, A., Kotthaus, J.P., Tuttle, G., English, J.H., and Kroemer, H., Surf. Science 267, 483 (1992).Google Scholar
8 Holmes, S., Cheng, J.-P., McCombe, B.D., and Schaff, W., Phys. Rev. Lett. 69, 2571 (1992).Google Scholar
9 Scriba, J., Wixforth, A., Kotthaus, J.P., Bolognesi, C.R., Nguyen, C., Tuttle, G., English, J.H., and Kroemer, H., Semicond. Sci. Technol. 8, S133 (1993).Google Scholar
10 Yang, M.J., Wagner, R.J., Shanabrook, B.V., Waterman, J.R., and Moore, W.J., Phys. Rev. B 47, 6807 (1993); M.J. Yang, P.J. Lin-Chung, B.V. Shanabrook, J.R. Waterman, R.J. Wagner, and W.J. Moore, 1691 (1993).Google Scholar