Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-27T01:52:06.027Z Has data issue: false hasContentIssue false
  • English
  • Français

Magnetic properties of submicron Ni-Mn-Ga martensitic thin films1

Published online by Cambridge University Press:  01 February 2011

M. Kohl ,
V.A. Chernenko ,
M. Ohtsuka ,
H. Reuter  and
T. Takagi
M. Kohl
Affiliation:
IMT, Forschungszentrum Karlsruhe, D-76021, Karlsruhe, Germany
V.A. Chernenko
Affiliation:
IMT, Forschungszentrum Karlsruhe, D-76021, Karlsruhe, Germany
M. Ohtsuka
Affiliation:
IMT, Forschungszentrum Karlsruhe, D-76021, Karlsruhe, Germany
H. Reuter
Affiliation:
IMRAM, Tohoku University, Sendai, 980–8577, Japan
T. Takagi
Affiliation:
IMF III, Forschungszentrum Karlsruhe, D-76021, Karlsruhe, Germany
Get access

Abstract

Two series of Ni-Mn-Ga thin films with two different compositions and various thicknesses in the submicron range are investigated with respect to their structural and magnetic properties. The films are fabricated by sputter deposition on alumina substrates and subsequent heat treatment. The martensitic transformation occurs well above room temperature showing a small thermal hysteresis width of about 6 K. The magnetic properties turn out to be thickness-dependent in the submicron range. In particular, in-plane magnetic susceptibilities increase and critical field strengths for onset of saturation decrease for decreasing thickness down to 0.1 μm by factors of 3–5 depending on the chemical composition. The Curie temperature TC decreases by about 25 K for samples with TC higher than the martensitic transformation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 855: Symposium W – Mechanically Active Materials , 2004 , W2.8
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Suorsa, I., Tellinen, J., Paguonis, E., Aaltio, I. and Ullakko, K., Applications of magnetic shape memory actuators, Proc. Actuator 2002, pp. 158–161.Google Scholar
2. Ohtsuka, M. and Itakagi, K., Effect of heat treatment on properties of Ni-Mn-Ga films prepared by a sputtering method, Int. J. of Appl. Electromagn. Mech. 12, 49–59 (2000).Google Scholar
3. Wuttig, M., Craciunescu, C. and Li, J., Phase transformations in ferromagnetic NiMnGa shape memory films, Materials Transactions JIM 41, 933–37 (2000).Google Scholar
4. Isokawa, S., Suzuki, M., Ohtsuka, M., Matsumoto, M. and Itagaki, K., Shape memory effect of sputtered Ni-rich Ni2MnGa alloy films aged at constraint condition, Materials Transactions JIM 42, 1886–1889, (2001).Google Scholar
5. Tello, P.G., Castano, F.J., O'Handley, R.C., Allen, S.M., Esteve, M., Castano, F., Labarta, A. and Battle, X., Ni-Mn-Ga thin films produced by laser deposition, J. Appl. Phys. 91, 8234–8236 (2002).Google Scholar
6. Rumpf, H., Feydt, J., Levandovski, D., Ludwig, A., Winzek, B., Quandt, E., Zhao, P. and Wuttig, M., Shape memory effect and magnetostriction of sputtered NiMnGa thin films, SPIE Proc. Series 5053, 191–199 (2003).Google Scholar
7. Kohl, M., Hoffmann, S, Liu, Y., Ohtsuka, M. and Takagi, T., Optical scanner based on a NiMnGa thin film microactuator, J. Phys. IV France 112, 1185–1188 (2003).Google Scholar
8. Dubowik, J., Kudryavtsev, Y.V. and Lee, Y.P., Martensitic transformation in Ni2MnGa films: A ferromagnetic resonance study, J. Appl. Phys. 95, 2912–2917 (2004).Google Scholar
9. Ohtsuka, M., to be published.Google Scholar
10. Ahn, J.P., Cheng, N., Lograsso, T. and Krishnan, K.M., Magnetic properties, structure and shape memory transitions in Ni-Mn-Ga thin films grown by ion-beam sputtering, IEEE Trans. Magn. 37, 2141–2143 (2001).Google Scholar