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Magnetic Effects at Surfaces and Interfaces (Including Grain Boundaries)

Published online by Cambridge University Press:  10 February 2011

A. J. Freeman ,
Ruqian Wu ,
Lujun Chen  and
Lieping Zhong
A. J. Freeman
Affiliation:
Department of Physics &; Astronomy, Northwestern University, Evanston, IL 60208
Ruqian Wu
Affiliation:
Department of Physics & Astronomy, California State University, Northridge, CA 91330
Lujun Chen
Affiliation:
Department of Physics & Astronomy, California State University, Northridge, CA 91330
Lieping Zhong
Affiliation:
Department of Physics &; Astronomy, Northwestern University, Evanston, IL 60208
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Abstract

First-principles electronic structure studies based on local spin density functional theory and performed on extremely complex simulations of ever increasingly realistic systems, play a very important role in explaining and predicting surface and interface magnetism. This has led to solving even more challenging problems like the embrittlement of the Fe grain boundary, discussed here. Now, a major issue for first-principles theory is the treatment of the weak spin-orbit coupling (SOC) in magnetic transition metals and their alloys and its subsequent effects: (i) A major breakthrough in eliminating the numerical randomness for the determination of the magneto-crystalline anisotropy was made with the state-tracking and torque approaches. This now enables us to treat magnetostriction and its inverse effect, strain-induced magnetic anisotropy in transition metal bulk, thin films and alloys, (ii) The magneto-optical Kerr effects and x-ray magnetic circular dichroism are now directly calculated and compared with experiment. In all this work, and more recently, on the first-principles calculations of giant magneto-resistance in multilayers, extensive first-principles calculations and model analyses provide simple physical insights and guidelines to search for new magnetic recording and sensor materials.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 492: Symposium S – Microscopic Simulation of Interfacial Phenomena in Solids… , 1997 , 301
Copyright
Copyright © Materials Research Society 1998

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References

[1] Freeman, A.J. and Wu, R.Q. J. Magn. Magn. Mater. 100, 497 (1991).Google Scholar
[2] Stöhr, J., J. Electron Spectroscopy and Rel. Phenom. 75, 253 (1995).Google Scholar
[3] Carcia, P.A., Meinholdt, A.D. and Suna, A., Appl. Phys. Lett. 47, 178 (1985).Google Scholar
[4] Baibich, M.N., Broto, J.M., Fert, A., Dau, A., Petroff, F., Eitenne, P., Creuzet, G., Friederich, A., and Chazelas, J., Phys. Rev. Lett. 61, 2472 (1988).Google Scholar
[5] Binasch, G., Grunberg, P., Saurenbach, F. and Zinn, W., Phys. Rev. B 39, 4828 (1989).Google Scholar
[6] Parkin, S.S.P., More, N. and Roche, K.P., Phys. Rev. Lett. 64, 2304 (1990).Google Scholar
[7] Dieny, B., Speriosu, V.S., Parkin, S.S.P., Gurney, A.B., Wilhoit, D.R. and Mauri, D., Phys. Rev. B 43, 1279 (1991).Google Scholar
[8] Hurst, J.E. Jr and Kozlovsky, W.J., Jpn. J. Appl. Phys. 32, 5301 (1993).Google Scholar
[9] Daughton, J.M., Thin Solid films, 216, 162 (1992).Google Scholar
[10] Wang, D.S., Wu, R.Q. and Freeman, A.J., Phys. Rev. Lett. 70, 869 (1993).Google Scholar
[11] Wang, X.D., Wu, R.Q., Wang, D.S., and Freeman, A.J., Phys. Rev. B 54, 61 (1996).Google Scholar
[12] Wimmer, E., Krakauer, H., Weinert, M. and Freeman, A. J., Phys. Rev. B 24, 864 (1981);Google Scholar
Weinert, M., Wimmer, E. and Freeman, A. J., Phys. Rev. B 26, 4571 (1982), and references therein.Google Scholar
[13] Roth, C., Kleeman, Th., Hillebrecht, F.U. and Kisker, E., Phys. Rev. B 52, 15691 (1995).Google Scholar
[14] Zhong, L.P., Wu, R.Q., Freeman, A.J. and Olson, G.B., J. Appl. Phys. 81, 4479 (1997).Google Scholar
[15] Olson, G.B., Science 277, 1237 (1997).Google Scholar
[16] Rice, J.R. and Wang, J-S., Mat. Sci. & Eng., A 107, 23 (1989);Google Scholar
Anderson, P.M., Wang, J-S. and Rice, J.R., in Innovations in Ultrahigh-strength Steel Technology, ed. Olson, G.B., Azrin, M. and Wright, E.S., Sagamore Army Materials Research Conference Proceedings: 34th (1990), p. 619.Google Scholar
[17] Briant, C.L. and Messmer, R.P., Phil. Mag. B 42, 569 (1980),Google Scholar
Messmer, R.P. and Briant, C.L., Acta. Metall. 30, 457 (1982).Google Scholar
[18] Eberhart, M.E. and Vvedensky, D.D., Ser. Metall. 22, 183 (1988);Google Scholar
MacLaren, J.M., Crampin, S., Vvedensky, D.D. and Eberhart, M.E., Phys. Rev. Lett. 63 2586 (1989).Google Scholar
[19] Krasko, G.L. and Olson, G.B., Solid State Commun. 76, 247 (1990).Google Scholar
[20] Tang, S., Freeman, A. J. and Olson, G.B., Phys. Rev. B 47, 2441 (1993).Google Scholar
[21] Wu, R., Freeman, A.J. and Olson, G.B., Science 265, 376 (1994); Phys. Rev. B 53, 7504 (1996).Google Scholar
[22] Zhong, L.P., Wu, R.Q., Freeman, A.J. and Olson, G.B., Phys. Rev. B 55, 11133 (1997).Google Scholar
[23] Wang, D.S., Wu, R.Q. and Freeman, A.J., Phys. Rev. B 47, 14932 (1993); Phys. Rev. B 48, 15883 (1993); J. Magn. Magn. Mater. 129, 327 (1994).Google Scholar
[24] Cullen, J. R., Clark, A.E. and Hathaway, K.B., in Materials Science and Technology, Ed. Cahn, R.W., Hasen, P. and Kramer, E.J., Vol. IIIB, 529 (1994).Google Scholar
[25] Perdew, J.P. et al, Phys. Rev. B 33, 8800 (1986); Phys. Rev. B 46, 6671 (1992).Google Scholar
[26] Engel, B.N., England, C.D., Van Leeuwen, R.A., Wiedmann, M.H. and Falco, C.M., Phys. Rev. Lett. 67, 1910 (1991).Google Scholar
[27] Levitin, R.Z. and Markosyan, A.S., J. Magn. Magn. Mater. 84, 287 (1990).Google Scholar
[28] Krinchik, G.S. and Artemev, V.A., Zh. Eksp. Theo Fiz. 53, 1901 (1967) [Sov. Phys. JETP 26, 1080 (1968)].Google Scholar
[29] Schütz, G., Wagner, W., Wilhelm, W., Kienle, P., Zeiler, R. and Materlik, G., Phys. Rev. Lett. 58, 737 (1987);Google Scholar
Stöhr, J., Science 259, 658 (1993).Google Scholar
[30] Thole, B.T., Carra, P., Sette, F. and van der Laan, G., Phys. Rev. Lett. 68 (1992) 1943;Google Scholar
Carra, P., Thole, B.T., Altarelli, M. and Wang, X-D., Phys. Rev. Lett. 70 (1993) 694.Google Scholar