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Magnetic Domain Imaging with a Photoemission Microscope

Published online by Cambridge University Press:  15 February 2011

C.M. Schneider
Affiliation:
Inst. f. Physik, Joh. Gutenberg-Universität, Staudingerweg 7, D-S5099 Mainz, Germany
R. Frömter
Affiliation:
Max-Planck-Institutf. Mikrostrukturphysik, Weinberg 2, D-06120 Halle, Germany
C. Ziethen
Affiliation:
Inst. f. Physik, Joh. Gutenberg-Universität, Staudingerweg 7, D-S5099 Mainz, Germany
W. Swiech
Affiliation:
F. Seitz Materials Research Lab., University of Illinois at Urbana-Champaign, IL 61801, USA
N.B. Brookes
Affiliation:
European Synchrotron Radiation Facility, RP220, F-38043 Grenoble, France
G. Schönhense
Affiliation:
Inst. f. Physik, Joh. Gutenberg-Universität, Staudingerweg 7, D-S5099 Mainz, Germany
J. Kirschner
Affiliation:
Max-Planck-Institutf. Mikrostrukturphysik, Weinberg 2, D-06120 Halle, Germany
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Abstract

Photoelectron emission microscopy (PEEM) has proven to be a versatile analytical technique in surface science. When operated with circularly polarized light in the soft x-ray regime, however, photoemission microscopy offers a unique combination of magnetic and chemical information. Exploiting the high brilliance and circular polarization available at a helical undulator beamline, the lateral resolution in the imaging of magnetic domain structures may be pushed well into the sub-micrometer range. Using a newly designed photoemission microscope we show that under these circumstances not only domains, but also domain walls can be selectively investigated. The high sensitivity of the technique yields a sizable magnetic contrast even from magnetic films as thin as a fraction of a single monolayer. The combination of chemical selectivity and information depth is successfully employed to investigate the magnetic behavior of buried layers and covered surfaces. This approach offers a convenient access to magnetic coupling phenomena in magnetic sandwiches.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

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