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Magnetic Domain Imaging of Epitaxial thin Films by Spin-Polarized Scanning Electron Microscopy

Published online by Cambridge University Press:  26 February 2011

R. Allenspach  and
M. Stampanoni
R. Allenspach
Affiliation:
IBM Research Division, Zurich Research Laboratory, 8803 Rüschlikon, Switzerland
M. Stampanoni
Affiliation:
IBM Research Division, Zurich Research Laboratory, 8803 Rüschlikon, Switzerland
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Abstract

The formation of magnetic domains in thin epitaxial Co/Au(111) films is investigated by spin-polarized scanning electron microscopy. Three-monolayer films are shown to decay into out-of-plane domains of micrometer size. The transition from out-of-plane to in-plane magnetization at a crossover thickness of 4.5 layers is followed by imaging the domains, and the transition is shown to occur as a continuous rotation of the magnetization. The domain size in field-free-grown perpendicular films depends linearly on film thickness. From high-resolution line scans across magnetization reversals we determine the resolution in magnetic imaging to be better than 40 nm.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 231: Symposium S – Magnetic Surfaces, Thin Films and Multilayers , 1991 , 17
Copyright
Copyright © Materials Research Society 1992

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References

[1] For a comprehensive review on thin film magnetism, see Appl. Phys. A 49, 437–629 (1989).Google Scholar
[2] Gay, J.G. and Richter, R., Phys. Rev. Lett. 56, 2728 (1986).CrossRefGoogle Scholar
[3] Chappert, C. et al. , J. Magn. Magn. Mat. 54, 795 (1986).Google Scholar
[4] Broeder, F.J.A. den et al. , Phys. Rev. Lett. 60, 2769 (1988).Google Scholar
[5] Lee, C.H. et al. , Phys. Rev. Lett. 62, 653 (1989)Google Scholar
[6] Carcia, P.F., Meinhaldt, A.D., and Suna, A., Appl. Phys. Lett. 47, 178 (1985).Google Scholar
[7] Lee, C.H. et al. , Phys. Rev. B 42, 1066 (1990).Google Scholar
[8] Lee, C.H. et al. , Phys. Rev. B 42, 11384 (1990).Google Scholar
[9] Allenspach, R., Stampanoni, M., and Bischof, A., Phys. Rev. Lett. 65, 3344 (1990).Google Scholar
[10] Koike, K., Matsuyama, H., and Hayakawa, K., Scanning Microsc. Suppl. 1, 241 (1987).Google Scholar
[11] Hembree, G.G. et al. , Scanning Microsc. Suppl. 1, 229 (1987).Google Scholar
[12] Taborelli, M., Ph.D. thesis, ETH No. 8545, Swiss Federal Institute of Technology (ETH), Zurich, Switzerland, 1988.Google Scholar
[13] Pappas, D.P. et al. , Phys. Rev. Lett. 66, 504 (1991).CrossRefGoogle Scholar
[14] Berning, G.L.P., Surface Sci. 61, 673 (1976).Google Scholar
[15] Dupas, C. et al. , J. Appl. Phys. 67, 5680 (1990).Google Scholar
[16] For a review see Argile, C. and Rhead, G.E., Surf. Sci. Rept. 10, 277 (1989).Google Scholar
[17] Bruno, P., J. Phys. F 18, 1291 (1988).Google Scholar
[18] Dionne, G.F., Mat. Res. Bull. 6, 805 (1971).Google Scholar
[19] Kittel, C., Phys. Rev. 70, 965 (1946).Google Scholar
[20] Beier, T. et al. , Phys. Rev. Lett. 61, 1875 (1988).Google Scholar
[21] Stampanoni, M. et al. , Phys. Rev. Lett. 59, 2483 (1987).Google Scholar
[22] Liu, C., Moog, E.R., and Bader, S.D., J. Appl. Phys. 64, 5325 (1988).CrossRefGoogle Scholar
[23] Oepen, H.P. et al. , J. Magn. Magn. Mat. 86, L137 (1990).Google Scholar
[24] Pommier, J. et al. , Phys. Rev. Lett. 65, 2054 (1990).Google Scholar
[25] Bruno, P. (private communication).Google Scholar
[26] Ferré, J. et al. , Appl. Phys. Lett. 56, 1588 (1990).CrossRefGoogle Scholar
[27] Yafet, Y. and Gyorgy, E.M., Phys. Rev. B 38, 9145 (1988).Google Scholar
[28] Chappert, C. and Bruno, P., J. AppI. Phys. 64, 5736 (1988).Google Scholar
[29] Note that the film thickness must be very uniform to lead to such a small transition width.Google Scholar
[30] Pescia, D. and Pokrovsky, V.L., Phys. Rev. Lett. 65, 2599 (1990).Google Scholar
[31] Jensen, P.J. and Bennemann, K.H., Phys. Rev. B 42, 849 (1990).Google Scholar
[32] The difference by a factor of 2 in the formula for Ki is due to the fact that Ref. 28 deals with Au/Co/Au(l11) bilayers in contrast to our Co/Au(1 11) film.Google Scholar
[33] Hubert, A. (private communication).Google Scholar
[34] Unguris, J. et al. , Appl. Phys. Lett. 55, 2553 (1989).Google Scholar
[35] Wohlfarth, E.P., in Ferromagnetic Materials, Vol. 1, edited by Wohlfarth, E.P., (North Holland, Amsterdam New York, 1980), Chapt. 1.Google Scholar
[36] Scheinfein, M.R. et al. , Phys. Rev. B 43, 3395 (1991).Google Scholar
[37] Middelhoek, S., J. Appl. Phys. 34, 1054 (1963).Google Scholar