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The Macroscope: A Macroscopic Tool for Validating Microscopic Force Relationships

Published online by Cambridge University Press:  15 March 2011

Claudio Guerra-Vela  and
Redy R. Zypman
Claudio Guerra-Vela
Affiliation:
University of Puerto Rico at HumacaoDepartment of Physics 100 Tejas Street Humacao, PR 00791-4300
Redy R. Zypman
Affiliation:
Yeshiva UniversityDepartment of Physics New York, NY 10033
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Abstract

The Force Macroscope (FM) was presented at the MRS-Spring-2000 as a laboratory teaching tool to introduce students to concepts of Scanning Force Microscopy (SFM). It is a macroscopic version of the SFM. The FM pedagogical advantage over the SFM is its size: students relate to the FM, only a few grasp at once the concepts for the 100 [.proportional]m-long SFM cantilever. In this work we will show how we take advantage of the FMs large size to teach concepts of force reconstruction.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 684: Symposium GG – Impacting Society Through Materials Science and Engineering Education , 2001 , GG6.8
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

[1] “Improved Algorithm to Extract Force-Distance Curves from Scanning Force Microscope Data”, Eppell, Steven J., Todd, Brian A., Zypman, Fredy R., in Materials Issues and Modeling for Device Nanofabrication, ed. Merhari, L. et al. , MRS 584, 189 (2000)Google Scholar
[2] “High Frequency Response of a Scanning Force Microscope Cantilever”, Zypman, Fredy R, Eppell, Steven J, J Vac Sci Technol B16, 2099 (1998)Google Scholar
[3] Turner, JA, Hirsekorn, S, Rabe, U, Arnold, W, J Appl Phys 82, 966 (1997)Google Scholar
[4] “Electrostatic tip-surface interaction in scanning force microscopy: a convenient expression useful for arbitrary tip and sample geometries”, Zypman, Fredy R, Eppell, Steven J, J Vac Sci Techn B15, 1853 (1997)Google Scholar