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Luminescence of Si-Implanted InP After Rapid Thermal Annealing

Published online by Cambridge University Press:  25 February 2011

D. Kirillov
Affiliation:
Varian Research Center, Palo Alto, CA 94303
J. L. Merz
Affiliation:
University of California - Santa Barbara, Department of Electrical and Computer Engineering, Santa Barbara, CA 93106
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Abstract

Changes in the luminescence spectra of InP caused by Si+ implantation and subsequent rapid lamp annealing were studied. It was found that the best activation of dopants was obtained in the case of hot implantation and lamp annealing in regimes close to melting of InP.

Type
Research Article
Copyright
Copyright © Materials Research Society 1985

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References

REFERENCES

[1] Pickering, C., Tapster, P. R., Dean, P. J., and Ashen, D. J., GaAs and Related Compounds, 1982, Inst. Phys. Conf. Ser. No. 65 (Institute of Physics, London, England, 1982), p. 469.Google Scholar
[2] Lorenzo, J. P., Davis, D. E., Soda, K. J., Ryan, T. G. and McNally, P. J., Laser-Solid Interactions and Transient Thermal Processing of Materials, eds. Narayan, J., Brown, W. L. and Lenanas, R. A. (North-Holland Publishing, New York, 1983), p. 683.Google Scholar
[3] Masum Choudhury, A. N. M., Tabatabaie-Alivi, K. and Fonstaf, C. G., Appl. Phys. Lett. 43, 381 (1983).Google Scholar
[4] Negreskul, V. V., Russu, E. V., Radautsan, S. I. and Cheban, A. G., Sov. Phys. Semicond. 9, 587 (1985).Google Scholar
[5] Kirillov, D. and Merz, J. L., Energy Beam-Solid Interactions and Transient Thermal Processing, eds. Fan, J. C. C. and Johnson, N. M., Materials Research Society Symposium Proceedings (Elsevier-North Holland, New York, 1984).Google Scholar
[6] Baumann, G. G., Benz, K. W. and Pilkuhn, M. H., J. Electrochem. Soc. 123, 1232 (1976).Google Scholar
[7] Hawrilo, F. Z., Appl. Phys. Lett. 37, 1038 (1980).Google Scholar
[8] De-Sheng, J., Makita, Y., Ploog, K. and Queisser, H. J., J. Appl. Phys. 53, 999 (1982).Google Scholar
[9] Bendapudi, S. and Bose, D. N., Appl. Phys. Lett. 42, 287 (1983).Google Scholar
[10] Mooradian, A. and Wright, G., Phys. Rev. Lett. 16, 999 (1966).Google Scholar