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Low-temperature technology and physical processes in green thin-film phosphor Zn2GeO4-Mn

Published online by Cambridge University Press:  21 March 2011

V. Bondar ,
S. Popovich ,
T. Felter  and
J. Wager
V. Bondar
Affiliation:
Lviv National University, Department of Physics, 50 Dragomanov Str., 79005, Lviv, Ukraine
S. Popovich
Affiliation:
Lviv National University, Department of Physics, 50 Dragomanov Str., 79005, Lviv, Ukraine
T. Felter
Affiliation:
Lawrence Livermore National Laboratory, PO Box 808, L - 356, Livermore, CA, 94550
J. Wager
Affiliation:
Department of Electrical and Computer Engineering, Oregon State University, Corvallis, Oregon 97331-3211, U. S. A
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Abstract

Thin-film Zn2GeO4:Mn phosphors with lower temperature of crystallization and potentially compatible with industrial technologies were investigated. The technology of thin films synthesis has been developed and their structure and crystal parameters have been investigated. Photoluminescence excitation spectra, photoconductivity, temperature dependencies and ESR-spectra of manganese ions were studied. A mechanism for luminescence in this phosphor has been proposed. Results are presented of cathodo- and electro-luminescence of thin film structures of Zn2GeO4:Mn.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 667: Symposium G – Luminescence and Luminescent Materials , 2001 , G7.6
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

1. Minami, T., in Proc. of 4-th Intern. Conf. on the Science and Technology of Display Phosphors (Bend, Oregon, 1998), pp. 195–198.Google Scholar
2. Kitaii, A. N., in Proc. of 4-th Intern. Conf. on the Science and Technology of Display Phosphors (Bend, Oregon, 1998), pp. 199–202.Google Scholar
3. Lewis, J. S. and Holloway, P.H., Journal of the Electrochemical Society 147 (8), 3148–3150 (2000)Google Scholar
4. Bondar, V., Vasyliv, M., Ukrainian patent No. 18151 A, (July 1997).Google Scholar
5. Lysoivan, V., Gromilov, S., Aspects of accuracy in polycrystalline diffractometry (Nauka, Novosibirsk, 1989 (in Russian)), p. 243.Google Scholar
6. Pecharski, V. K., Axelrood, L. D. and Zavalii, P. Yu., Crystallography 32 (6), 874–877 (1987).Google Scholar
7. Segmuller, A., J. Vac. Sci. Technol. A 9 (4), 2477–2480 (1991).Google Scholar
8. Kuang, Vu., Fok, M. V. in Luminescence centers in crystals (Trudy FIAN, 79, Nauka, Moskov, 1974 (in Russian)), pp. 39–63.Google Scholar
9. Hanzawa, H., Kobayashi, M., Matsuda, O., Murase, K. and Giriat, W., Phys. Stat. Sol. (a) 175, 715 (1999).Google Scholar