Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-27T01:36:13.255Z Has data issue: false hasContentIssue false

Low-cost Micro- and Nano-structures in Porous Nanomaterials Realized by Direct Imprinting of Porous Substrates

Published online by Cambridge University Press:  11 August 2011

Judson D. Ryckman
Affiliation:
Department of Electrical Engineering and Computer Science, Vanderbilt University Nashville, TN 37235, USA
Marco Liscidini
Affiliation:
Dipartimento di Fisica “A. Volta”, Università degli Studi di Pavia, via Bassi 6, 27100 Pavia, Italy
J. E. Sipe
Affiliation:
Department of Physics and Institute for Optical Sciences, University of Toronto 60 St. George St. Toronto M5S 1A7 Ontario, Canada
S. M. Weiss
Affiliation:
Department of Electrical Engineering and Computer Science, Vanderbilt University Nashville, TN 37235, USA
Get access

Abstract

We present a simple one-step methodology for direct structuring of porous nanomaterials on the micro- and nano-scale. Our technique, direct imprinting of porous substrates (DIPS), relies on the application of a pre-patterned and reusable stamp to directly imprint porous substrates. DIPS is performed at room temperature and pressure in less than one minute, and circumvents the conventional requirement for resist processing and etching procedures. It is shown that arbitrarily shaped patterns and structures can be transferred to porous nanomaterials with a very high (sub-100nm) feature resolution that is primarily limited by the pore dimensions of the substrate material. DIPS is demonstrated on a wide variety of porous nanomaterials including metals, semiconductors, and insulators. Furthermore, DIPS can be utilized to locally modify material properties including pore dimensions, density, dielectric function, and surface roughness. Lastly, example structures fabricated by DIPS are discussed for their relevance to important applications ranging from drug delivery and imaging, to solar energy conversion, and biosensing.

Type
Research Article
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Li, A. P.; Müller, F.; Birner, A.; Nielsch, K.; Gösele, U. J. Appl. Phys. 1998, 84, 6023.Google Scholar
2. Ding, Y.; Kim, Y.-J.; Erlebacher, J. Adv. Mater. 2004, 16, 1897.Google Scholar
3. Kasuga, T.; Hiramatsu, M.; Hoson, A.; Sekino, T.; Niihara, K. Langmuir 1998, 14, 3160.Google Scholar
4. Smith, R. L.; Collins, S. D. J. Appl. Phys. 1992, 71, R1.Google Scholar
5. Tasciotti, E.; Liu, X.; Bhavane, R.; Plant, K.; Leonard, A. D.; Price, B. K.; Cheng, M. M.-C.; Decuzzi, P.; Tour, J. M.; Robertson, F.; Ferrari, M. Nature Nanotechnol. 2008, 3, 151.Google Scholar
6. Park, J.-H.; Gu, L.; Maltzahn, G. von; Ruoslahti, E.; Bhatia, S. N.; Sailor, M. J. Nature Mater. 2009, 8, 331.Google Scholar
7. Alvarez, S. D.; Li, C.-P.; Chiang, C. E.; Schuller, I. K.; Sailor, M. J. ACS Nano 2009, 3, 3301.Google Scholar
8. Ryckman, J. D.; Liscidini, M.; Sipe, J. E.; Weiss, S. M. Appl. Phys. Lett. 2010, 96, 171103.Google Scholar
9. Biener, J.; Nyce, G. W.; Hodge, A. M.; Biener, M. M.; Hamza, A. V.; Maier, S. A. Adv. Mater. 2008, 20, 1211.Google Scholar
10. Ciesielski, P. N.; Scott, A. M.; Faulkner, C. J.; Berron, B. J.; Cliffel, D. E.; Jennings, G. K. ACS Nano 2008, 2, 2465.Google Scholar
11. Ito, S.; Zakeeruddin, S. M.; Comte, P.; Liska, P.; Kuang, D.; Grätzel, M. Nature Photon. 2008, 2, 693.Google Scholar
12. Chou, S. Y.; Keimel, C.; Gu, J., Nature 2002, 417, 835.Google Scholar
13. Gong, J.; Lipomi, D. J.; Deng, J.; Nie, Z.; Chen, X.; Randall, N. X.; Nair, R.; Whitesides, G. M. Nano Lett. 2010, 10, 2702.Google Scholar
14. Ryckman, J. D.; Liscidini, M.; Sipe, J. E.; Weiss, S. M. Nano Lett. 2011, 11(5), 1857.Google Scholar
15. Rong, G; Ryckman, J. D.; Mernaugh, R. L.; Weiss, S. M. Appl. Phys. Lett. 2008, 93, 161109.Google Scholar
16. Wei, X.; Weiss, S. M. MRS Online Proceedings Library 2011, 1301, 03.Google Scholar