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Low Temperature Ceramic Coatings for Environmental Protection of Integrated Circuits

Published online by Cambridge University Press:  25 February 2011

Grish Chandra*
Affiliation:
Electronics Research, Dow Corning Corporation, Midland, MI 48686
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Abstract

A novel concept for improved environmental protection of integrated circuits uses thin, in-situ formed ceramic layers on the circuit surface. Metastable ceramic precursors, hydrogen silsesquioxane and silacyclobutane, convert to pure silica and amorphous silicon carbide dielectric films respectively upon processing at temperatures from 175 to 250ºC. These twolayer ceramic films were shown to protect silicon CMOS circuits from industry-recognized autoclave and HAST exposure environments for more than 400 hours whereas unprotected circuits always failed within 200 hours.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

1. Trager, R.K., Proceedings 25th Electronic Components Conference, 361 (1976); R.K. Ulrich, A.J. Phillips, D.H. Yi, W.D. Brown, S.S. Ang, Microelectronics and Reliability (in press).Google Scholar
2. Denboer, A.J., Philips Electron Optics Reporter, 31, No. 3EM, 1 (1985).Google Scholar
3. Roy, R., J. Amer. Chem. Soc., 39, 145, (1956).Google Scholar
4. Baney, R.H. and Chandra, G., Mark-Bikales-Overberger-Menges, Encyclopedia of Polymer Science and Engineering 13, 2nd Edition, John Wiley and Sons, New York, pp. 312344, (1988).Google Scholar
5. Frye, C.L. and Collins, W.T., J. Amer. Chem. Soc., 92, 5586, (1970).Google Scholar
6. MIL-STD 883C, Method 2021.3, Procedure B.Google Scholar
7. Cawthon, G.D., D'Errico, J.J., and Schulz, W.J. Jr., U.S. 4,973,723 (27 November 1990).Google Scholar
8. Snow, S.S. and Chandra, G., “Surface Protected Electronic Circuits Research,” Final Technical Report for Period 15 August 1986 to 14 September 1989, AFOSR Contract F49620-86-C-0110, Dow Corning (30 November 1989).Google Scholar
9. Snow, S.S. and Chandra, G., Government Microelectronic Applications Conference (GOMAC), Las Vegas, NV, 529 (6-8 November 1990).Google Scholar