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Long-Term Cathodoluminescent Characterization of Thin-Film Oxide Phosphors in a Wide Range of Electron Excitation Densities

Published online by Cambridge University Press:  21 March 2011

Vyacheslav D. Bondar ,
Thomas E. Felter ,
Charles E. Hunt ,
Yuri G. Dubov  and
Andrei G. Chakhovskoi
Vyacheslav D. Bondar
Affiliation:
Lviv National University, Department of Physics, 50 Dragomanov Str., 79005, Lviv, Ukraine
Thomas E. Felter
Affiliation:
Lawrence Livermore National Laboratory, PO Box 808, L - 356, Livermore, CA, 94550
Charles E. Hunt
Affiliation:
University of California at Davis, Department of Electric and Computer Engineering, Davis, CA, 95616
Yuri G. Dubov
Affiliation:
Lviv National University, Department of Physics, 50 Dragomanov Str., 79005, Lviv, Ukraine
Andrei G. Chakhovskoi
Affiliation:
University of California at Davis, Department of Electric and Computer Engineering, Davis, CA, 95616
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Abstract

Long-term processes of cathodoluminescence degradation of thin film phosphors Zn2SiO4:Ti and Zn2GeO4:Mn were investigated in a wide range of e-beam energies, current and power densities. The time dependencies describing the decreasing of emission intensity have been found. At higher current densities of e-beam irradiation, the specific behavior of long-term degradation processes was observed, which is characterized by rapid initial degradation and a slower long term decrease. The most probable mechanisms are proposed for long-term processes of degradation in the investigated phosphors.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 667: Symposium G – Luminescence and Luminescent Materials , 2001 , G7.4
Copyright
Copyright © Materials Research Society 2001

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References

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