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Lomer Dislocations in (0 0 1) GaSb/GaAs Heterostructure.

Published online by Cambridge University Press:  25 February 2011

André M. Rocherj
Affiliation:
Centre d'Elaboration des Matdriaux et d'Etudes Structurales, Centre National de la Recherche Scientifique, 29, rue Jeanne Marvig, F-31055, Toulouse, France.
Joon M. Kang
Affiliation:
Centre d'Elaboration des Matdriaux et d'Etudes Structurales, Centre National de la Recherche Scientifique, 29, rue Jeanne Marvig, F-31055, Toulouse, France.
Anne Ponchet
Affiliation:
Centre d'Elaboration des Matdriaux et d'Etudes Structurales, Centre National de la Recherche Scientifique, 29, rue Jeanne Marvig, F-31055, Toulouse, France.
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Abstract

The (001) GaSb/GaAs heterostructure reveals a nearly complete relaxation of the misfit strain. This relaxation is connected to the highly regular network of Lomer dislocations which is a consequence of island growth conditions.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

Bollmann, W, Crystal Lattices, Interfaces, Matrices, Ed. Bollmann, 1982.Google Scholar
Bourret, A, Fuoss, P H, Rocher, A and Raisin, C 1990, Mat. Res. Soc. Symp. Proc. Editors TC Huang, PT Cohen, DJ Eaglesham, Vol 208,Google Scholar
Edington, JW, Pract. Electron Microsc. Mater. Sci, 3 Mc Millan Press ltd 1975.Google Scholar
Hirth, and Lothe, , Theory of dislocations, Mc Graw Hill, 1968.Google Scholar
Kiely, C J, Chyi, J I, Rockett, A and Morkoç, H 1989, Phil. Mag. A, 60, no 3, 321–37.Google Scholar
Pond, R. This Mat. Res. Soc. Symp. Proc. (1991)Google Scholar
Raisin, C, Rocher, A, Landa, G, Caries, R and Lassabatére, L 1991, Appl. Surf. Science, 50, 434 Google Scholar
Raisin, C, Saguintaah, B, Tetegmousse, H, Lassabatére, L, Girault, B & Allibert, C 1986, Ann. Telecommun. 41, 50.Google Scholar
Rocher, A, Da Silva, F W and Raisin, C, 1990, Rev. Phys. Appl. 25, 957.CrossRefGoogle Scholar
Rocher, A, Kang, JM, Atmani, H, Crestou, J, Vanderschaeve, G, Lassabatére, L and Bonnet, R, 1991, Inst. Phys. Conf. Ser. no 117, 509.Google Scholar
Rocher, A and Raisin, C 1991, Springer Proceedings in Physics: Polycrystalline Semiconductors II, Vol. 54, Eds. Werner, J.H. and Strunk, H.P., 483.Google Scholar
Zhang, X, Staton-Bevan, A E, Pashley, D W, Parker, S D, Droopad, R, Williams, R L and Newman, R C 1990, J. Appl. Phys., 67, pp 800806.Google Scholar
Zhu, J G and Carter, C B 19901, Phil. Mag. A, 62, No 3, pp 319–28.CrossRefGoogle Scholar