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Load- and Depth-Sensing Indentation Tester for Properties Measurement at Non-Ambient Temperatures

Published online by Cambridge University Press:  15 February 2011

Karl B. Yoder  and
Donald S. Stone
Karl B. Yoder
Affiliation:
Materials Science Program, University of Wisconsin-Madison, 1500 Johnson Dr., Madison, WI 53706
Donald S. Stone
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, 1509 University Avenue, Madison, WI 53706
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Abstract

The ability to measure the temperature-dependence of the hardness of thin films is useful from both an applications and a scientific standpoint. For this reason, we have designed and constructed a load- and depth-sensing indentation tester combining sub-nanometer resolution with the ability to operate over a range of temperatures, currently 150K to 400K. This paper describes the new experimental apparatus and reports preliminary data on 440C stainless steel substrates with and without a 0.75 μm ZrN coating.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 308: Symposium M1 – Thin Films: Stresses and Mechanical Properties IV , 1993 , 121
Copyright
Copyright © Materials Research Society 1993

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References

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