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Lithium nanocluster formation in Li+ - ion implanted MgO

Published online by Cambridge University Press:  17 March 2011

A. van Veen ,
M.A. van Huis ,
A.V. Fedorov ,
H. Schut ,
C.V. Falub ,
S.W.H. Eijt ,
F. Labohm ,
B.J. Kooi  and
J.Th.M. De Hosson
A. van Veen
Affiliation:
Interfaculty Reactor Institute, Delft University of Technology, Mekelweg 15, NL-2629JB, Delft, The Netherlands.
M.A. van Huis
Affiliation:
Interfaculty Reactor Institute, Delft University of Technology, Mekelweg 15, NL-2629JB, Delft, The Netherlands.
A.V. Fedorov
Affiliation:
Interfaculty Reactor Institute, Delft University of Technology, Mekelweg 15, NL-2629JB, Delft, The Netherlands.
H. Schut
Affiliation:
Interfaculty Reactor Institute, Delft University of Technology, Mekelweg 15, NL-2629JB, Delft, The Netherlands.
C.V. Falub
Affiliation:
Interfaculty Reactor Institute, Delft University of Technology, Mekelweg 15, NL-2629JB, Delft, The Netherlands.
S.W.H. Eijt
Affiliation:
Interfaculty Reactor Institute, Delft University of Technology, Mekelweg 15, NL-2629JB, Delft, The Netherlands.
F. Labohm
Affiliation:
Interfaculty Reactor Institute, Delft University of Technology, Mekelweg 15, NL-2629JB, Delft, The Netherlands.
B.J. Kooi
Affiliation:
Materials Science Center, University of Groningen, Nijenborgh 4, 4797 AG Groningen, The Netherlands
J.Th.M. De Hosson
Affiliation:
Materials Science Center, University of Groningen, Nijenborgh 4, 4797 AG Groningen, The Netherlands
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Abstract

Photon absorption (PA), Positron Beam Analysis (PBA) and Neutron Depth Profiling (NDP) is applied to study the relation between photon absorption behavior and the precipitates formed by ion implantation and thermal annealing. Monocrystals of MgO(100) were implanted with 1.0×10166Li ions cm−2 at an energy of 30 keV. The samples were thermally annealed in air in steps up to 1200 K. After each step Doppler broadening Positron Beam Analysis (PBA) was applied to monitor the depth profile of the implantation defects. The evolution of the depth profile of lithium was followed with the aid of NDP. During the annealing there is hardly any change in the location of the lithium implantation peak at 150 nm (peak concentration 2 at. %). Only after annealing to 1200 K the majority of the lithium has left the crystal and optical absorption effects have disappeared. During annealing at 750 K an absorption band develops between 400 and 600 nm; at 950 K the maximum absorption is centered at 450 nm corresponding to Mie absorption and scattering by lithium nanoclusters. Positron beam analysis shows a considerable increase of annihilations with low momentum electrons in the implanted zone. A positron method for measuring electron momentum distributions (2D-ACAR) coupled to an intense positron beam gave evidence for the presence of semi-coherent metallic lithium inclusions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 647: Symposium O – Ion Beam Synthesis & Processing of Advanced Materials , 2000 , O11.24
Copyright
Copyright © Materials Research Society 2001

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References

1. Abraham, M.M., Chen, Y., Boatner, L.A., Reynolds, R.W., Phys. Rev. Lett. 37, No. 13, 849 (1976).Google Scholar
2. Marichy, G., Chassagne, G., Durand, D., Physica Status solidi B 92, No. 1, 221 (1979).Google Scholar
3. Treilleux, M., Chassagne, G., J. de Physique Lettres 40, No. 13, L283 (1979).Google Scholar
4. Ziegler, J.F., Biersack, J.P. and Litmark, U., The Stopping and Range of Ions in Solids, (Pergamon, New York, 1985).Google Scholar
5. Kreibig, U., Vollmer, M., Optical properties of metal clusters (Springer series in materials science v.25), Springer-Verlag, Berlin Heidelberg (1995).Google Scholar
6. Veen, A. van, Schut, H. and Mijnarends, P.E., Ch. 6, in: Positron beams and their applications, Ed. Coleman, P.G., (World Scientific, Singapore, 2000) pp.191–225.Google Scholar
7. Veen, A. van, Schut, H., Labohm, F., Roode, J. De, Eijt, S.W.H., Mijnarends, P.E., Proceedings ICPA-12, Munich, 2000, in press.Google Scholar
8. West, R.N., in Positron Spectroscopy of Solids, Eds. Dupasquier, A., Mills, A.P. Jr, IOS Press, Amsterdam (1995), 75.Google Scholar
9. Krings, L.H.M., Tamminga, Y., Berkum, J. van, Labohm, F., Veen, A. van, Arnoldbik, W.M., J. Vac. Sci. Technol. A17, 198 (1999).Google Scholar
10. Downing, R.G., Lamaze, G.P., Neutron News 4, No. 1, 15 (1993).Google Scholar
11. Falub, C.V., Eijt, S.W.H., Huis, M.A. van, Veen, A. van, Schut, H., Mijnarends, P.E., to be publishedGoogle Scholar
12. Donaghy, J.J., Stewart, A.T., Phys. Rev. 164, No. 2, 391 (1967).Google Scholar
13. Kooi, B.J., Veen, A. van, Hosson, J.Th.M. De, Schut, H., Fedorov, A.V., Labohm, F., Appl. Phys. Lett. 76, No. 9, 1110 (2000).Google Scholar