Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-03T00:41:31.507Z Has data issue: false hasContentIssue false

Light-Induced Microstructural Ordering: Study Of Lithium-Incorporated Cobalt Oxide Films On Aluminium And Glass Substrate

Published online by Cambridge University Press:  15 February 2011

Mahua Das
Affiliation:
Materials Research Centre, Indian Institute of Science, Bangalore-560 012, INDIA
G. N. Subbanna
Affiliation:
Materials Research Centre, Indian Institute of Science, Bangalore-560 012, INDIA
S.A. Shivashankar
Affiliation:
Materials Research Centre, Indian Institute of Science, Bangalore-560 012, INDIA
Get access

Abstract

Photocrystallization is a phenomenon whereby an amorphous matrix undergoes structural changes to micro- or nano-crystals upon irradiation with photons. Topologically, a crystalline phase embedded in an amorphous matrix is expected to be advantageous over a fully crystalline phase, in applications such the as cathode material in thin film lithium-ion rechargeable batteries. As this particular microstructural feature provides a high surface area and enables smooth contacts, it may be expected to result in fast ion conduction between cathode and electrolyte, while retaining the electrochemical property associated with the specific crystal structure of the material. Amorphous films of lithium- incorporated cobalt oxide were obtained on glass and aluminium substrate using a sol gel spin-coating technique. The photocrystallization and microstructural changes in these films upon irradiation with unpolarised light were investigated using XRD, SEM, and TEM analysis.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Lyubin, V., Klebanov, M., Mitkova, M., Petkova, T., J. Non-Cryst. Solids 739, 227 (1998)Google Scholar
2. Chakarov, D., Kasemo, B., Phys. Rev. Lett. 81, 5181 (1998)Google Scholar
3. Hollar, E.P., Robertson, I.M., Jencic, I., Mat. Res. Soc. Sym. Proc. 650, R9.4/014.4.1 (2001).Google Scholar
4. Baugh, J., Han, D., Phys. Rev. B 66, 115203 (2002)Google Scholar
5. Doshi, D.A., Huesing, N.K., Lu, M., Fan, H., Lu, Y., Potter, K.S., Potter, B. G. Jr, Hurd, A.J., Brinker, C.J., Science 290, 107 (2000)Google Scholar
6. Kolobov, A.V., Oyanagi, H., Tanaka, K.T., Phys. Rev. Lett. 87, 145502 (2001)Google Scholar
7. Chen, G., Jain, H., Vlcek, M., Khalid, S., Li, J., Drabold, D.A., Elliot, S.R., Appl. Phys. Lett. 82, 706 (2003)Google Scholar