Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-20T01:11:43.149Z Has data issue: false hasContentIssue false
  • English
  • Français

Lattice Parameter Determination of Textured Co81−xCr15PtxTa4 Thin Films

Published online by Cambridge University Press:  10 February 2011

B. Lu ,
S. D. Harkness ,
W. A. Lewis ,
D. E. Laughlin  and
D. N. Lambeth
B. Lu
Affiliation:
Data Storage System Center, Carnegie Mellon University, Pittsburgh, PA 15213
S. D. Harkness
Affiliation:
Intevac, Vacuum Systems Division, Santa Clara, CA 95054
W. A. Lewis
Affiliation:
Intevac, Vacuum Systems Division, Santa Clara, CA 95054
D. E. Laughlin
Affiliation:
Data Storage System Center, Carnegie Mellon University, Pittsburgh, PA 15213
D. N. Lambeth
Affiliation:
Data Storage System Center, Carnegie Mellon University, Pittsburgh, PA 15213
Get access

Abstract

The thin films Co81−xCr15PtxTa4 with (0002) crystallographic texture have been sputter deposited with and without substrate bias. The lattice parameter of the thin films has been determined by a combination of x-ray diffraction and electron diffraction techniques. The resolution of the electron diffraction was enhanced by a digital imaging technique. The variation rate of the a lattice parameter with Pt content is consistent with Vegard's law. The change in the c lattice parameter is much greater than what is expected from Vegard's law.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 562: Symposium L – Polycrystalline Metal & Magnetic Thin Films , 1999 , 117
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Inaba, N., Nakamura, A., Yamamoto, T., Hosoe, Y., and Futamoto, M., J. Appl. Phys. 79, 5354 (1996).Google Scholar
2. Deng, Y. and Lambeth, D. N., IEEE Trans. Magn. 29, 3676 (1993).Google Scholar
3. Hirose, T., Teranishi, H., Ohsawa, M., Yeda, A., Ishiwata, O., IEEE Trans. Magn. 33, 2971 (1997).Google Scholar