Hostname: page-component-cd9895bd7-mkpzs Total loading time: 0 Render date: 2024-12-27T02:04:19.983Z Has data issue: false hasContentIssue false

Laser-Based Area-Selective Processing Techniques for High-Density Interconnects

Published online by Cambridge University Press:  21 February 2011

Y.S. Liu
Affiliation:
GE Research and Development Center; P.O. Box 8, Schenectady, NY, 12345
H. S. Cole
Affiliation:
GE Research and Development Center; P.O. Box 8, Schenectady, NY, 12345
Get access

Abstract

This paper reviews several laser-based area-selective processing techniques developed for high-density multichip interconnection applications. Key material and process requirements for the development of a viable laser-direct-write interconnect technique on polyimide are addressed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Ehrlich, D.J. and Tsao, J.Y., Ed. “Laser Microfabrication: Thin Film Processing and Lithography,” Academic Press, (1989).Google Scholar
2. Liu, Y.S., in “Tungten and Other Refractory Metals Deposition for VLSI Applications,” edited by Blewer, R.I., Materials Research Society, p. 43 (1985).Google Scholar
3. Liu, Y.S. and Cole, H.S., in “Electronic Packaging Materials Science IV,” ed. by Jaccodine, R., Jackson, K.A., Lillie, D. and Sundahl, R.C., Mat. Res. Soc. Proc. Vol. 154, (1989)Google Scholar
4. Liu, Y.S., “Sources, Optics and Laser Microfabrication Systems for direct Writing and Projection Lithography,” in “Laser Microfabrication and Thin Film Processes and Lithography,” Ed. by Ehrlich, D.J. and Tsao, J.Y., Academy Press, p.3, (1989)Google Scholar
5. Neugebauer, C.A., Carlson, R.O., Fillion, R.A., and Haller, T.R., Solid State Tech. p. 93 (June 1988), and the related references cited in the paper.Google Scholar
6. Eichelberger, C.W., Wojnarowski, R.J., Carlson, R.O., and Levinson, L.M., SPIE Symposium on Innovative Science and Tech. Paper 877-15 (January 1988).Google Scholar
7. Tuckerman, D.W., IEEE Elec. Dev. Lett. EDL–8, 11, pp. 540543 (1987)Google Scholar
8. Cole, H.S., Liu, Y.S., Rose, J.W., and Guida, R., Appl. Phys. Lett. 53, 2111 (1988).Google Scholar
9. Cole, H.S., Liu, Y.S., Guida, R., and Rose, J., SPIE 877, p. 92 (1988).Google Scholar
10. Bachmann, F., Chemtronics, Vol.4, No.3, (1989)Google Scholar
11. Liu, Y.S., Cole, H.S., Philipp, H.R. and Guida, R., Proc. of SPIE, “Lasers in Microl-ithography,” Vol. 774, (1987)Google Scholar
12. Cole, H.S., Liu, Y.S., Rose, J.W., Guida, R., Levinson, L.M., and Philipp, H.R., Conf. Proc. For Microelectronic Applications, Honolulu, Hawaii (1987).Google Scholar
13. Cole, H.S., Liu, Y.S., Phillip, H.R., and Guida, R., Mat. Res. Soc. Symp. Proc. 72, p. 241 (1986).Google Scholar
14. Liu, Y.S. and Cole, H.S., Chemtronics, Vol.4, No.3, 209, (1989)Google Scholar
15. Gross, M.E., Chemtronics, Vol.4, No.3, 197, (1989)Google Scholar
16. Esrom, H. and Wahl, G., Chemitronics, Vol.4, No.3, 216 (1989)Google Scholar
17. Esrom, H., Demny, J. and Kogelschatz, U., Chemtronics, Chemtronics, Vol.4, No.3, 202, (1989)Google Scholar
18. Zhang, Y. and Stuke, M., Chemtronics, Vol.4, No.3, 212, (1989)Google Scholar
19. Liu, Y.S., Grubb, W.T., and Cole, H.S., in Tech Digest of Conf. on Lasers and Electro-Optics, WX-5, p. 286 (1988).Google Scholar