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Laser Annealing of Hydrogenated Amorphous Silicon ThickFilms
Published online by Cambridge University Press: 15 February 2011
Abstract
Hydrogenated amorphous silicon thick films deposited by dc glow discharge onmolybdenum substrates were annealed by a pulsed Nd:glass laser. Massspectrometry showed hydrogen remaining in all the laser annealed films. Theamount of hydrogen remaining decreased with decreasing scan rate. Thehydrogen evolved upon heating at 365 °C and mainly at 658 °C before laserannealing, but at 365, 575 (Mainly) and 645 °C after laser annealing,indicating weakening of the silicon-hydrogen bonding after laser annealing.The presence of hydrogen inhibited crystallization, as indicated by Ramanscattering. The photo and dark conductivity of the film increased by one andthree orders of magnitude respectively with increasing laser energy densityup to 12 J/cm2 at a fixed scan rate. This Means that thephotoresponse was decreased with laser annealing, in spite of the associatedincrease in crystallinity. This photoresponse decrease is attributed to thehydrogen evolution.
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- Copyright © Materials Research Society 1994