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Large-area Metrology of CVD-grown Graphene Layers on Copper Foil Substrates

Published online by Cambridge University Press:  30 July 2012

Dennis L. Pleskot ,
Jennifer R. Kyle ,
Maziar Ghazinejad ,
Shirui Guo ,
Isaac Ruiz ,
Mihrimah Ozkan  and
Cengiz S. Ozkan
Dennis L. Pleskot
Affiliation:
Materials Science and Engineering Program, University of California Riverside, CA 92521, USA
Jennifer R. Kyle
Affiliation:
Department of Electrical Engineering, University of California Riverside, CA 92521, USA
Maziar Ghazinejad
Affiliation:
Department of Mechanical Engineering and the Materials Science and Engineering Program, University of California Riverside, CA 92521, USA
Shirui Guo
Affiliation:
Department of Chemistry, University of California Riverside, CA 92521, USA
Isaac Ruiz
Affiliation:
Department of Electrical Engineering, University of California Riverside, CA 92521, USA
Mihrimah Ozkan
Affiliation:
Department of Electrical Engineering, University of California Riverside, CA 92521, USA
Cengiz S. Ozkan
Affiliation:
Department of Mechanical Engineering and the Materials Science and Engineering Program, University of California Riverside, CA 92521, USA
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Abstract

Fluorescence Quenching Microscopy has been shown to be an effective means of characterizing graphene on the macroscale. Centimeter-scale CVD-grown pristine and doped graphene were manufactured in a high temperature (1000°C) furnace on pristine copper substrates. The copper was then etched away in a FeCl3solution and the graphene was coated with DCM-based fluorescent dye before being imaged in a fluorescence microscope. The fluorescence image was then image-processed using modified Matlab software. The resulting image showed clear contrast between the pristine graphene sheet and defects on the graphene surface, which revealed that fluorescence microscopy could determine the quality of a large region of graphene. Also, significant contrast was identified between single-layer and multi-layer regions, showing that this technique is also effective at determining the degree of uniformity within a graphene sample. Lastly, the fluorescence images showed contrast between doped and undoped regions of graphene.

Keywords

nanoscalemorphologydefects
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1451: Symposium DD/EE – Nanocarbon Materials and Devices , 2012 , pp. 45 - 49
Copyright
Copyright © Materials Research Society 2012

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References

REFERENCES

Lee, C. et al. . Science 321, 385–8 (2008).CrossRefGoogle Scholar
Castro Neto, A., Guinea, F., Peres, N., Novoselov, K., Geim, A., Rev. Mod. Phys. 81, 109 (2009).CrossRefGoogle Scholar
Chen, S., Wu, Q., Mishra, C., et al. . Nature Materials 11, 203 (2012).CrossRefGoogle Scholar
Nair, R. R., Blake, P., Grigorenko, A. N., Novoselov, K. S., Booth, T. J., Stauber, T., Peres, N. M. R., Geim, A. K., Science 320, 1308 (2008).CrossRefGoogle Scholar
Geim, A., Novoselov, K., Nat. Mater. 6, 183 (2007).CrossRefGoogle Scholar
Treossi, E., Melucci, M., et al. , J. Am. Chem. Soc. 131, 15576–15577 (2009).CrossRefGoogle Scholar
Kim, J., Cote, L. J., et al. , J. Am. Chem. Soc. 132, 260–267 (2010).CrossRefGoogle Scholar
Liu, Y., Liu, C., and Liu, Y., Applied Surface Science 257, 5513–5518 (2011).CrossRefGoogle Scholar
Sagar, A., Kern, K., and Balasubramanian, K., Nanotechnology 21, 015303 (2009).CrossRefGoogle Scholar
Li, X. et al. . Science. 324, 1312–1314 (2009).CrossRefGoogle Scholar