Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-06T07:01:07.929Z Has data issue: false hasContentIssue false

Kinetic Study of the Passive Film on 304 Stainless Steel Using a Scanning Tunneling Microscope

Published online by Cambridge University Press:  15 February 2011

T. J. McKrell
Affiliation:
Department of Metallurgy and Institute of Materials Science, University of Connecticut, Storrs, CT 06269-3136
J. M. Galligan
Affiliation:
Department of Metallurgy and Institute of Materials Science, University of Connecticut, Storrs, CT 06269-3136
Get access

Abstract

The unique capability of the scanning tunneling microscope, STM, for in situ nanoscale electronic measurements has been utilized to establish the nature of the oxide film on 304 stainless steel under HCI, distilled water, and in air. New insights were obtained concerning the kinetics and electronic surface states of the oxide film as a function of exposure time to these environments: quantitative measurements of the corrosion behavior and the stability of the oxide film, as related to observed defects, have been obtained. These findings have resulted in a model which incorporates these new insights with previously established theories concerning oxidized surfaces.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Asami, K., Hashimoto, K. and Shimodaira, S., Corrosion Science. 18, p. 151 (1978).Google Scholar
2. Olefjord, I. and Fischmeister, H., Corrosion Science. 15, p. 697 (1975).Google Scholar
3. Berneron, R., Charbonnier, J. C., Namdar-Irani, R. and Manenc, J., Corrosion Science. 20, p. 899 (1980).Google Scholar
4. Asami, K. and Hashimoto, K., Corrosion Science. 19, p. 1007 (1979).Google Scholar
5. Marcus, P. and Olefjord, I., Corrosion Science. 28, p. 589 (1988).Google Scholar
6. Tool & Alloy Steels. December 1991, p. 473477 (1991).Google Scholar
7. Srivastava, S. C., Indian Journal of Technology. 28, p. 715 (1990).Google Scholar
8. Jin, S. and Atrens, A., Appl. Phys. A. 50, p. 287 (1990).Google Scholar
9. Schmuki, P. and Bohni, H. in Electronic Properties -and their Local Resolution- of Passive Films on Stainless Steels, (Proceedings of the Symposium on Oxide Films On Metals and Alloys, Publ: The Electrochemical society, Inc., Pennington, NJ 1992), p. 326339.Google Scholar
10. Paola, Agatino Di, Shukla, Deepak and Stimming, Ulrich, Electrochimica Act. 36, p. 345 (1991).Google Scholar
11. De Vito, E. and Marcus, P., Surface and Interface Analysis. 19, p. 403 (1992).Google Scholar
12. Szklarska-Smialowska, Z. in Advances in Localized Corrosion, edited by Isaacs, H. S., Bertocci, U., Kruger, J. and Smialowska, S. (Proceedings of the Second International Conference on Localized Corrosion Texas June 1–5, 1987, Pub. by the National Association of Corrosion Engineers, Houston, Orlando, FL 1990), p. 4146.Google Scholar
13. Cabrera, N. and Mott, N. F., Reports on Progress in Physics. 12, p. 163 (1949).Google Scholar
14. Fontana, Mars G., Corrosion Engineering, 3rd ed., McGraw-Hill, Inc., 1986, p. 469481.Google Scholar
15. Halpern, V., Philosophical Mag., B. 49, L57 (1984).Google Scholar
16. Schmuki, A. P. and Bohni, H., J. Electrochem. Soc.. 139, p. 1908 (1992).Google Scholar
17. Chao, C. Y., Lin, L. F. and Macdonald, D. D., J. Electrochem. Soc.. 128, p. 1187 (1981).Google Scholar
18. Chao, C. Y., Lin, L. F. and Macdonald, D. D., J. Electrochem. Soc.. 128, p. 1194 (1981).Google Scholar
19. McBee, C. L. and Kruger, J. in Localized Corrosion, edited by Staehle, R. W. (NACE, Houston, TX 1974), p. 252258.Google Scholar
20. Moffat, Thomas P., Fan, Fu-Ren F. and Bard, Allen J., J. Electrochem. Soc. 138, p. 3224 (1991).Google Scholar
21. Devereux, Owen F., Topics in Metallurgical Thermodynamics, Robert E. Krieger Publishing Co., Inc., 1989.Google Scholar
22. Labusch, R. and Schröter, W., Electrical Properties of Dislocations in Semiconductors. Dislocations in Solids, vol.5, edited by Nabarro, F. R., North-Holland Publishing Company, 1983, pp. 127191.Google Scholar
23. Bonnel, Dawn A., Scanning Tunneling Microscopy and Spectroscopy Theory. Techniques. and Applications, VCH Publishers, Inc., New York, New York, 1993, pp. 287333.Google Scholar