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Kinetic Investigations of Alkoxysilane Sol-Gel Processing

Published online by Cambridge University Press:  28 February 2011

K. A. Hardman-Rhyne ,
T. D. Coyle ,
E. P. Lewis  and
S. Spooner
K. A. Hardman-Rhyne
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, MD 20899
T. D. Coyle
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, MD 20899
E. P. Lewis
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, MD 20899
S. Spooner
Affiliation:
Oak Ridge National Laboratory, P.O. Box X, Oak Ridge, TN 37830
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Abstract

Effective control of sol-gel glass processing requires a detailed understanding of the kinetic and mechanistic aspects of the process. We have investigated structural evolution at the molecular level in the tetramethoxysilane (TMOS) hydrolysis reaction by various spectroscopic techniques. Development of structure at the macromolecular level and evolution of particle/network dimensionality have been studied by small-angle x-ray scattering (SAXS) in both hydrogenated and fully deuterated reactions for silica macromolecular structural development.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 73: Symposium H – Better Ceramics Through Chemistry II , 1986 , 173
Copyright
Copyright © Materials Research Society 1986

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References

REFERENCES

1. Iler, R.K., The Chemistry of Silica (John Wiley, New York, 1979), pp. 172–311.Google Scholar
2. Yamane, Masayuki, Inoue, Satoru and Yasumori, Atsuo, J. of Non-Cryst. Sol. 63, 13 (1984).Google Scholar
3. Schmidt, H., Scholze, H. and Kaiser, A., J. of Non-Cryst. Sol. 63, 1 (1984).Google Scholar
4. Keefer, K.D., Mat. Res. Soc. Symp. Proc. 32, 15 (1984).Google Scholar
5. Schaefer, Dale W. and Keefer, Keith D., Mat. Res. Soc. Symp. Proc. 32, 1 (1984).Google Scholar
6. Brinker, C.J., Keefer, K.D., Schaefer, D.W., Assink, R.A., Kay, B.D. and Ashley, C.S., J. of Non-Cryst. Sol. 63, 45 (1984).CrossRefGoogle Scholar
7. Hardman-Rhyne, K.A. and Berk, N.F., Materials Characterization for Systems Performance and Reliability, ed. McCauley, James W. and Weiss, Volker, Plenum Publishing Corp., New York, 257, (1986).CrossRefGoogle Scholar
8. Kolb, M. and Jullien, R., J. Physique Lett. 45, L977 (1984).CrossRefGoogle Scholar
9. Schaefer, Dale W. and Keefer, Keith D., to be published in Ultrastructure Properties of Materials, ed. D. Ulrich.Google Scholar