Hostname: page-component-7bb8b95d7b-fmk2r Total loading time: 0 Render date: 2024-10-05T22:18:59.625Z Has data issue: false hasContentIssue false

Ion Irradiation Smoothing and Film Bonding for Laser Mirrors

Published online by Cambridge University Press:  25 February 2011

P. P. Pronko
Affiliation:
Universal Energy Systems, 4401 Dayton-Xenia Road, Dayton, OH 45432
A. W. Mccormick
Affiliation:
Universal Energy Systems, 4401 Dayton-Xenia Road, Dayton, OH 45432
D. C. Ingram
Affiliation:
Universal Energy Systems, 4401 Dayton-Xenia Road, Dayton, OH 45432
A. K. Rai
Affiliation:
Universal Energy Systems, 4401 Dayton-Xenia Road, Dayton, OH 45432
J. A. Woollam
Affiliation:
University of Nebraska, Lincoln, NB
B. R. Appleton
Affiliation:
Solid State Division, Oak RidgeNational Lab, Oak Ridge, TN 37830
D. B. Poker
Affiliation:
Solid State Division, Oak RidgeNational Lab, Oak Ridge, TN 37830
Get access

Abstract

Irradiation with high energy heavy ion beams has been investigated as a technique for improving the quality of highly reflecting metallic surfaces to be used as laser mirrors. Properties such as reflectivity, corrosion resistance, film bonding, and threshold to laser surface damage have been examined. Modifications of composition and microstructure of the material associated with the heavy ion irradiation have been measured with RBS, TEM, SEM, Auger, and ESCA. Reflectivity and extinction coefficient measurements were made using ellipsometry techniques. Observations indicate that keV heavy ion irradiations in the fluence range of 1015 to 1016 cm−2 produce significant surface smoothing. Additionally, MeV implants of heavy ions into films of Cu, Ag, Au and Al deposited on molybdenum substrates resulted in improvements to both tarnish resistance and structural bonding integrity.

Type
Research Article
Copyright
Copyright © Materials Research Society 1984

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Dearnaley, G., Rad. Effects 63, 25 (1982).Google Scholar
2. Biersack, S., Nucl. Instrum. & Methods 174, 257 (1980).Google Scholar
3. Werner, B. T. et al, Thin Solid Films 104, 163 (1983) andGoogle Scholar
Griffith, J. E. et al, Nucl. Instrum. & Methods 198, 607 (1982).Google Scholar
4. Marth, W., Z. Angew. Phys. 13, 224 (1961).Google Scholar
5. Sizmann, R., J. Nucl. Materials 69 & 70, 386 (1978) andGoogle Scholar
Sizmann, R. and Daeunent, V., Rad. Damage in Solids, 1, 351 (1962), IAEA, Vienna.Google Scholar
6. Azzam, R. M. A. and Bashara, N. M., Ellipsometry and Polarized Light, North Holland Pub. Co., Amsterdam 1977.Google Scholar