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Ion Beam Irradiation-induced Amorphization in Nano-sized KxLnyTa2O7-v Tantalate Pyrochlore

Published online by Cambridge University Press:  08 March 2011

Fengyuan Lu
Affiliation:
Department of Mechanical, Aerospace & Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, U.S.A.
May Nyman
Affiliation:
Sandia National Laboratories, P.O. Box 5800, Albuquerque, NM 87185, U.S.A.
Yiqiang Shen
Affiliation:
Department of Mechanical, Aerospace & Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, U.S.A. School of Materials Science and Engineering, Nanyang Technological University, Singapore 639798
Zhili Dong
Affiliation:
School of Materials Science and Engineering, Nanyang Technological University, Singapore 639798
Gongkai Wang
Affiliation:
Department of Mechanical, Aerospace & Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, U.S.A. Key Laboratory for Anisotropy and Texture of Materials of Ministry of Education, Northeastern University, Shenyang, Liaoning 110004, China
Fuxiang Zhang
Affiliation:
Departments of Geological Sciences and Materials Science & Engineering, University of Michigan, Ann Arbor, MI 48109-1005, U.S.A.
Rodney Ewing
Affiliation:
Departments of Geological Sciences and Materials Science & Engineering, University of Michigan, Ann Arbor, MI 48109-1005, U.S.A.
Jie Lian
Affiliation:
Department of Mechanical, Aerospace & Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, U.S.A.
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Abstract

The radiation response of nano-sized tantalate pyrochlores, KxLnyTa2O7-v (Ln = Gd, Y, and Lu) with average grain sizes of ~ 10 nm was investigated using 1 MeV Kr2+ ion beam irradiations. EDS measurements and XRD refinement reveal that the Y3+ and Lu3+-doped samples consist of two pyrochlore phases as K0.8YTa2O6.9/K0.4Y0.8Ta2O6.4 and KLuTa2O7/K0.4Lu0.8Ta2O6.4 respectively; whereas a single phase of K0.8GdTa2O7 only exists in the Gd3+-doped tantalate pyrochlore. In situ TEM observation confirms ion beam-induced amorphization occurring in all of the nano-sized KxLnyTa2O7-v. At elevated temperatures, both K0.8GdTa2O7 and K0.8YTa2O6.9/K0.4Y0.8Ta2O6.4 exhibit higher radiation tolerance than KLuTa2O7/K0.4Lu0.8Ta2O6.4, and the critical temperatures of K0.8GdTa2O7 and K0.8YTa2O6.9/K0.4Y0.8Ta2O6.4 are estimated to be 1167 ± 41 K and 1165 ± 34 K, respectively, lower than that of KLuTa2O7/K0.4Lu0.8Ta2O6.4 (~ 1291 K). The K0.8GdTa2O7, K0.8YTa2O6.9 and KLuTa2O7 phases have less structural deviation from the parent fluorite structure and thus may be responsible for the overall radiation tolerance. The high K+ occupancy at pyrochlore A sites in KLuTa2O7 is believed to contribute to the decrease of radiation tolerance, consistent with the large ionic radius ratio of K+/Ta5+. These results highlight that the radiation tolerance of nanostructured materials is highly compositional dependent, and nano-sized tantalate pyrochlores are sensitive to radiation damage.

Type
Articles
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Ewing, R.C., Weber, W.J., and Lian, J., J. Appl. Phys. 95, 5949 (2004).Google Scholar
2. Raison, P.E., Haire, R.G., Sato, T., and Ogawa, T., Mater. Res. Soc. Symp. Proc. 556, 3 (1999).Google Scholar
3. Wang, S.X., Begg, B.D., Wang, L.M., Ewing, R.C., Weber, W.J., and Kutty, K.V.G., J. Mater. Res. 14, 4470 (1999).Google Scholar
4. Lian, J., Zu, X.T., Kutty, K.V.G., Chen, J., Wang, L.M., and Ewing, R.C., Phys. Rev. B 66, 054108(2002).Google Scholar
5. Lian, J., Chen, J., Wang, L.M., Ewing, R.C., Farmer, J.M., Boatner, L.A., and Helean, K.B., Phys. Rev. B 68, 134107 (2003).Google Scholar
6. Patel, M.K., Vijayakumar, V., Avasthi, D.K., Kailas, S., Pivin, J.C., Grover, V., Mandal, B.P., and Tyagie, A.K., Nucl. Instrum. Methods Phys. Res., Sect. B 266, 2898 (2008).Google Scholar
7. Zhang, Z.L., Xiao, H.Y., Zu, X.T., Gao, F., and Weber, W.J., J. Mater. Res. 24, 1335 (2009).Google Scholar
8. Sickafus, K.E., Minervini, L., Grimes, R.W., Valdez, J.A., Ishimaru, M., Li, F., McClellan, K.J., and Hartmann, T., Science 289, 748 (2000).Google Scholar
9. Zhang, J., Lian, J., Fuentes, A., Zhang, F.X., Lang, M., Lu, F.Y., and Ewing, R.C., Appl. Phys.Lett. 94, 243110 (2009).Google Scholar
10. Nyman, M., Rodriguez, M.A., Shea-Rohwer, L.E., Martin, J.E., and Provencio, P.P., J. Am. Chem. Soc. 131, 11652(2009).Google Scholar
11. Wang, S.X., Wang, L.M., and Ewing, R.C., Mater. Res. Soc. Symp. Proc. 504, 165 (1998).Google Scholar
12. Wang, S.X., Wang, L.M., and Ewing, R.C., Phys. Rev. B 63, 024105 (2001).Google Scholar