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Investigation of Titanium Germanide Formation by Raman Scattering and X-Ray Absorption Spectroscopy
Published online by Cambridge University Press: 25 February 2011
Abstract
The reactions of titanium on germanium were studied using Raman spectroscopy and X-ray Absorption Spectroscopy (XAS). Samples used in this study were produced in a custom MBE system with dual E-gun sources, two filament sources, and base pressure <1x10−10 Torr. Ge(100) substrates were prepared by chemical cleaning and homoepitaxial deposition of 500Å - 1000Å Ge at 550°C. Ti was deposited and subsequently annealed at 50°C intervals from 500°C to 700°C. Raman and XANES spectra of the titanium germanides were obtained and used to examine the.evolution of the crystalline structures which form by the interface reactions of Ti on Ge. A low-order phase formed by diffusion controlled growth prior to the formation of TiGe2 (isomorphous with TiSi2 [C54]) by nucleation controlled growth.
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- Copyright © Materials Research Society 1991
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