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Investigation of the Optical Properties of epitaxial-lateral-overgrown GaN on R- and M- plane Sapphire
Published online by Cambridge University Press: 01 February 2011
Abstract
Optical properties of GaN templates grown by the Epitaxial Lateral Overgrowth (ELO) technique along the nonpolar (1120) and the semipolar (1122) directions on R- and M-sapphire were investigated. Spatially resolved Cathodoluminescence (CL) was carried out in order to identify defect related transitions, to resolve their localization and to study the efficiency of ELO concerning defect filtration. The wing region of semipolar GaN is shown to be almost defect free with a luminescence spectrum dominated by the GaN emission at 3,472 eV. It is shown that the defect related emissions are localized in the seed, but different defects occur as well in the wing, especially in A-plane (nonpolar) GaN.
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- Copyright © Materials Research Society 2007