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Investigation of the Field Emission Current from Polycrystalline Diamond Films

Published online by Cambridge University Press:  15 February 2011

J. W. Glesener
Affiliation:
Naval Research Laboratory 4555 Overlook Ave. Washington, DC 20375
A. A. Morrish
Affiliation:
Naval Research Laboratory 4555 Overlook Ave. Washington, DC 20375
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Abstract

The field emission current from boron doped polycrystalline diamond films was characterized as a function of voltage and temperature. The motivation for the current-temperature measurements was to assess the thermal stability of the diamond emitters and gain some insight into a possible emission mechanism.

Results from the current-temperature (I-T) measurements found that the field emission current appeared independent of temperature. The best characterization of the results implied a temperature independent electron tunneling mechanism if not electron emission from the valence band of diamond.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

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References

1. Himpsel, F. J., Knapp, J. A., VanVechten, J. A., and Eastman, D. E., Phys. Rev., B 20 (1979) 624.Google Scholar
2. Weide, J. van der and Nemanich, R. J., J. Vac. Sci. Technol., B12 (1994) 2475.Google Scholar
3. Eimori, N., Mori, Y., Hatta, A., Ito, T., and Hiraki, A., Jpn. J. Appl. Phys. 33 (1994) 6315.Google Scholar
4. Wang, C., Garcia, A., Ingram, D. C., Lake, M., and Kordesch, M. E., Electron. Lett., 27 (1991) 1459.Google Scholar
5. Nakahata, H., Imai, T., and Fujimori, N., Proc. 2nd Int. Conf. on New Diamond Science and Technology, 1991 pp. 487493.Google Scholar
6. Modinos, A., Field, Thermionic, and Secondary Electron Emission Spectroscopy. Plenum, New York, 1980, chap. 8.Google Scholar
7. Stratton, R., Phys. Rev. 125 (1962) 67.Google Scholar
8. Pate, B. B., Stefan, P. M., Binns, C., Jupiter, P. J., Shek, M. L., Lindau, I., and Spicer, W. E., J. Vac. Sci. Technol. 17 (1980) 1087.Google Scholar
9. Kubiak, G. D. and Kolasinski, K. W., Phys. Rev. B 39 (1989) 1381.Google Scholar
10. Bandis, C. and Pate, B. B., Phys. Rev. B 52 (1995) 12056.Google Scholar
11. Huang, Z.-H., Cutler, P. H., Miskovsky, N. M., and Sullivan, T. E., J. Vac. Sci. Technol. B13 (1995) 526.Google Scholar