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Investigation of local light scattering properties of thin-film silicon solar cells with subwavelength resolution

Published online by Cambridge University Press:  27 June 2011

K. Bittkau ,
A. Hoffmann ,
J. Owen  and
R. Carius
K. Bittkau
Affiliation:
IEK5-Photovoltaik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
A. Hoffmann
Affiliation:
IEK5-Photovoltaik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
J. Owen
Affiliation:
IEK5-Photovoltaik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
R. Carius
Affiliation:
IEK5-Photovoltaik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
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Abstract

In order to obtain efficient light trapping within a thin-film silicon solar cell, randomly textured interfaces are used. The texture can be introduced by wet-chemical etching in diluted hyrdofluoric acid (HF). By varying of the HF concentration, a continuous transition to smaller surface structures can be achieved. Near-field scanning optical microscopy is applied to measure scattered light with sub-wavelength resolution. On those different surfaces, using Fourier high-pass filters on the measured near-field images, surface features with a high light trapping potential are identified. Finally, criteria for optimized scattering surfaces are obtained.

Keywords

texturethin filmscanning probe microscopy (SPM)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1321: Symposium A – Amorphous and Polycrystalline Thin-Film Silicon Science and Technology , 2011 , mrss11-1321-a11-04
Copyright
Copyright © Materials Research Society 2011

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References

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