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Investigation of Irradiation Damage in Silicon Dioxide Polymorphs using Cathodoluminescence Microanalysis.

Published online by Cambridge University Press:  17 March 2011

Marion A. Stevens-Kalceff
Marion A. Stevens-Kalceff*
Affiliation:
Department of Applied Physics, University of Technology, Sydney. PO Box 123 Broadway NSW [email protected]
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Abstract

Cathodoluminescence (CL) Microanalysis (spectroscopy and microscopy) provides unique high sensitivity, high spatial resolution information about the defect structure and distribution of defects in wide band gap materials and therefore is an ideal technique with which to investigate the microstructural processes induced by irradiation. CL microanalytical techniques allow the in situ monitoring and post irradiation assessment of electron irradiation induced damage. Changes in the defect structure and surface topography of electron irradiated silicon dioxide polymorphs and related silicates including pure crystal quartz, pure silica glasses, pure amorphous fused quartz and alkali-borosilicate glasses, have been investigated and compared using CL microanalysis and Scanning Probe Microscopy (SPM) techniques. CL and SPM evidence shows all specimens are sensitive to electron irradiation. CL evidence is consistent with the production and micro-segregation of irradiation induced defects. The observed damage is highly correlated with the electron irradiation induced changes in the surface topography of the investigated specimens.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 647: Symposium O – Ion Beam Synthesis & Processing of Advanced Materials , 2000 , O14.5/R9.5
Copyright
Copyright © Materials Research Society 2001

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