Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-27T02:40:38.308Z Has data issue: false hasContentIssue false
  • English
  • Français

Intrasubband 1.55 μm Electrooptical Modulation in SiGe Asymmetric Quantum Well Structures

Published online by Cambridge University Press:  25 February 2011

Lionel R. Friedman  and
Richard A. Soref
Lionel R. Friedman
Affiliation:
National Science Research Council, Senior Fellow
Richard A. Soref
Affiliation:
USAF Rome Laboratory, RL/EROC, Hanscom Air Force Base, MA 01731
Get access

Abstract

A new, fast, intrasubband 1.55 μm electrooptic modulator in the SiGe/Si/CaF2-on-Si steppedquantum- well system is proposed and analyzed. At electric fields of ±8 V/μm, resonant 1-3 conduction intrasubband absorption is predicted to give 18 dB of optical extinction for narrow-linewidth transitions. We expect this field effect modulator to have microwave response, plus compatibility with Si-based optoelectronic integration.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 298: Symposium B – Silicon-Based Optoelectronic Materials , 1993 , 63
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Fejer, M.M, Yoo, S.J.R., Beyer, R.L., Harwit, A., and Harris, J.S. Jr., Phys. Rev. Lett., 62, 1041 (1989)Google Scholar
2. Khurgin, J., J. Opt. Soc. Am. B6, 1673, (1989)Google Scholar
3. Friedman, L. and Soref, R. A., Electronics Letters, 22, 819, (1986)Google Scholar
4. Karunisari, R.P.L., Mii, Y.J., and Wang, K.L., IEEE Electron Devics Letters, 11, 227, (1990)CrossRefGoogle Scholar
5. Ando, T., Fowler, A.B., and Stern, F., Rev. Mod. Phys., 54, 460, (1982)Google Scholar
6. Walle, C.G. Van de and Martin, R.M., Phys. Rev. B4, 5621, (1986)Google Scholar
7. Schowalter, L.J. and Fathauer, R.W., CRC Critical Reviews, 15, 367,(1989)Google Scholar
8. Hertle, H., Schaffler, F., Zrenner, A., Abstreiter, G., and Gornik, E., Thin Solid Films, 222, 20, (1992)Google Scholar