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Interfacial Structure of Electrically Conducting Adsorbed Multilayers

Published online by Cambridge University Press:  15 February 2011

G. J. Kellogg ,
A.M. Mayes ,
W. B. Stockton ,
M. Ferreira ,
M.F. Rubner  and
S.K. Satija
G. J. Kellogg
Affiliation:
Department of Materials Science and Engineering, M.I.T., Cambridge, MA 02139
A.M. Mayes
Affiliation:
Department of Materials Science and Engineering, M.I.T., Cambridge, MA 02139
W. B. Stockton
Affiliation:
Department of Materials Science and Engineering, M.I.T., Cambridge, MA 02139
M. Ferreira
Affiliation:
Department of Materials Science and Engineering, M.I.T., Cambridge, MA 02139
M.F. Rubner
Affiliation:
Department of Materials Science and Engineering, M.I.T., Cambridge, MA 02139
S.K. Satija
Affiliation:
Reactor Radiation Division, Natl. Institute of Standards and Technology, Gaithersburg, MD 20899
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Abstract

The multilayer organization of sulfonated polyaniline/polyallylamine (SPAN/PAH) films was investigated by neutron reflectivity. Films were prepared by sequential adsorption of polycations and polyanions from dilute solution. Scattering contrast was achieved by selective deuteration of blocks of bilayers at varying intervals along the films. The internal organization of the multilayer structure was found to decay significantly with increasing number of bilayer depositions. In addition, a high degree of roughness was determined at the free surfaces of the films. Together, these results suggest that both conformal and nonconformal roughness are present in the films, i.e., defects introduced during individual layer depositions are to some degree transferred to the surface of subsequently deposited layers.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 351: Symposium V – Molecularly Designed Ultrafine/Nanostructured Materials , 1994 , 325
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

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