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Interfacial Free Energies and the Creep of Multilayer Thin Films

Published online by Cambridge University Press:  10 February 2011

D. Josell  and
W. C. Carter
D. Josell
Affiliation:
Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899.
W. C. Carter
Affiliation:
Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899.
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Abstract

Experiments utilizing the creep properties of multilayer thin films to determine interfacial free energies are presented with essential theory. A new technique utilizing tubular multilayer foils is then described.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 505 , 1997 , 157
Copyright
Copyright © Materials Research Society 1998

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References

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