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Interfacial Composition and Structure in Pt/Ni and Pt/Nb Multilayer Films

Published online by Cambridge University Press:  21 February 2011

J.A. Bain
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305–2205.
B.M. Clemens
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305–2205.
S. Brennan
Affiliation:
Stanford Synchrotron Radiation Lab, Stanford University, Stanford, CA 94305.
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Abstract

The interfacial structure of Pt/Nb and Pt/Ni sputtered multilayer films was studied using x-ray diffraction in symmetric, asymmetric, and grazing incidence modes. The grazing incidence and asymmetric diffraction were used to distinguish alloying effects on the lattice spacing from strain in the films. This strain was shown to be consistent with semi-coherent interfaces in the Pt/Ni but not in the Pt/Nb in which another strain generating mechanism dominates.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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