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Interface Roughness: What is it and How is it Measured?
Published online by Cambridge University Press: 25 February 2011
Abstract
A panel discussion on interface roughness was held at the Fall 1992 Materials Research Society meeting. We present a summary of the results presented by the invited speakers on the application and interpretation of X-ray reflectivity, atomic force microscopy (AFM), scanning tunneling microscopy (STM), photoluminescence and transmission electron microscopy. A transcript of the moderated discussion is provided in the final section.
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- Research Article
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- Copyright © Materials Research Society 1993
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