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Interface Controlled Amorphization of Crystalline Ni/Ti Multilayers

Published online by Cambridge University Press:  21 February 2011

Alan F. Jankowski ,
Jeffrey P. Hayes  and
Philip B. Ramsey
Alan F. Jankowski
Affiliation:
Lawrence Livermore National Laboratory, Livermore, California 94550 U.S.A
Jeffrey P. Hayes
Affiliation:
Lawrence Livermore National Laboratory, Livermore, California 94550 U.S.A
Philip B. Ramsey
Affiliation:
Lawrence Livermore National Laboratory, Livermore, California 94550 U.S.A
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Abstract

Solid-State Amorphization (SSA) of crystalline interfaces is observed in the Ni/Ti multilayer system. The amorphization reaction nucleates at location(s) of crystallographic disorder, i.e. the multilayer interfaces. Microstructural analyses reveal the sputter-deposited growth structure to be epitaxial with semi-coherent interfaces. Strain energy originating from interface lattice distortions varies as a function of the multilayer repeat spacing. Therefore, the interfacial energy effects the onset conditions for SSA. Differential thermal analysis is used to measure the critical temperature Tc, to the nucleation of the SSA, which is found to vary with the Ni/Ti multilayer pair spacing.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 319: Symposia CB – Defect-Interface Interactions , 1993 , 381
Copyright
Copyright © Materials Research Society 1994

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