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Interface Characterisation Using an SEM-Based Micro-Indentor
Published online by Cambridge University Press: 15 February 2011
Abstract
The design and performance of an SEM-based microindentor, for interfacial property measurements in CMCs, is described. It enables high resolution imaging and simultaneous load/displacement monitoring with capacity and resolution of 20N ± lmN (load) and 100μm ± 10nm (displacement). Its application to measurement of interface debond and shear stresses for a wide range of fibres and monofilaments is described.
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- Research Article
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- Copyright © Materials Research Society 1995
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