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The Interface Between High Tc Superconductors and Silver Contacts

Published online by Cambridge University Press:  28 February 2011

Malcolm D. Mcconnell
Affiliation:
General Electric Corporate Research and Development, 1 River Road, Schenectady, NY 12301
William G. Morris
Affiliation:
General Electric Corporate Research and Development, 1 River Road, Schenectady, NY 12301
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Abstract

Silver diffuses into the lattice of YBa2Cu307 during the annealing of silver contacts at 500°C. Depth profiles using Auger electron spectroscopy, with a focused electron beam, show an extensive diffusion zone, as well as segregation of barium and oxygen to the surface of the contact. There appears to be a slight loss of silver from the surface region, which could be explained by enhanced concentration at grain boundaries. High resolution SEM analysis of a fracture surface did not reveal the presence of silver on the grain boundaries. Diffusion rates were correlated with grain orientation by using magnetically aligned samples, and were found to be greater for the direction parallel to the C axis.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

1 Ekin, J.W., Larson, T.M., Bergren, N.F., Nelson, A.J., Swartzlander, A.B., Kazmerski, L., Apply. Phys. Letter, 52 (21) 18191821 (1988).Google Scholar
2 Tzeng, Y., Electrochem. Soc. Comm. 13091310 (1988).Google Scholar