Hostname: page-component-78c5997874-t5tsf Total loading time: 0 Render date: 2024-11-19T15:22:10.441Z Has data issue: false hasContentIssue false

Interactions of Indium, Arsenic and Carbon in Silicon Using the Pseudopotential Technique

Published online by Cambridge University Press:  17 March 2011

M. Shishkin
Affiliation:
Emerging Technologies Research Centre, De Montfort University, Leicester UK LE1 9BH
A. Yan
Affiliation:
Emerging Technologies Research Centre, De Montfort University, Leicester UK LE1 9BH
M. M. De Souza
Affiliation:
Emerging Technologies Research Centre, De Montfort University, Leicester UK LE1 9BH
Get access

Abstract

Factors limiting the activation of indium in silicon are examined via the ab initio pseudopotential technique. The role of carbon in the enhancement/retardation of activation/diffusion respectively is clarified. It is found that (1) adjacent substitutional indium atoms are deactivated. Only second neighbour sites of indium are activated unlike the case of boron, where all substitutional sites remain activated. (2) Silicon self-interstitials deactivate indium by trapping them on substitutional sites. Carbon, on the other hand, traps such self- interstitials with higher binding energy and prevents them from deactivating indium. (3) Since both indium and carbon diffusion is interstitial mediated, carbon reduces indium diffusion on account of its higher binding energy with the self-interstitial. Moreover, the release of the carbon interstitial is more favourable than the release of the indium interstitial from a carbon-indium pair. Therefore, carbon minimises indium interstitial diffusion. (4) Arsenic enhances de- activation of indium by neutralisation and by strong binding on adjacent substitutional sites. Furthermore since the release of the indium interstitial is more favourable in comparison to the release of the arsenic interstitial from the indium-arsenic pair, indium diffusion is enhanced in the presence of arsenic.

Type
Research Article
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Magna, A. La, Scalese, S., Alippi, P., Mannino, G., Privitera, V. et al. APL 83, 1956 (2003).Google Scholar
2. Boudinov, H., Souza, J.P de and Saul, C.K. J.A.P Vol 8 (10) 15 Nov 1999.Google Scholar
3. P.B.Griffin, Cao, M., Voorde, P. Vande, Chang, Y. L., Greene, W.M., APL, 73, P.2986–8(1998).Google Scholar
4. Kresse, G and Furthmüller, J, Comput Mater. Sci 6.16 (1996). G Kresse and J.Hafner, Phys.Rev B 47 558 (1993).Google Scholar
5. Vanderbilt, D., Phys Rev B, vol 41 78927895 (1990).Google Scholar
6. Scalese, S. et al. , J Appl. Phys., Vol. 93, No. 12, 15 June 2003.Google Scholar
7. Baron, R., Young, M. H., Neeland, J. K., and Marsh, O. J. Appl. Phys.Lett 30, 594(1977).Google Scholar
8. Aronowitz, S. et al. J Vac Sci. Technol. B 20(1), p230237 Jan/Feb 2002. V Zubkov et al. Mat Res. Soc symp. Pro. Vol.669 (2001).Google Scholar