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In-Situ XPS Study of the Aluminum Poly(p-Phenylenevinylene) Interface

Published online by Cambridge University Press:  15 February 2011

K. Konstadinidis ,
F. Papadimitrakopoulos ,
M. Galvin  and
R. Opila
K. Konstadinidis
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
F. Papadimitrakopoulos
Affiliation:
Institute of Materials Science, University of Connecticut, Storrs, CT 06269
M. Galvin
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
R. Opila
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
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Abstract

The chemical and electronic properties of aluminum/poly(p-phenylenevinylene) (PPV) interfaces were studied in situ using x-ray photoelectron spectroscopy (XPS). It was observed that the aluminum atoms react with the oxygen-containing groups present as impurities on the surface of PPV to form Al-O-C linkages. The Al atoms also interact with the wrsystem of the polymer as indicated by changes in the valence band. Contrary to to recent suggestions (Ettedgui et al.) the relation between surface oxygen content and band bending is not straightforward, as shown by deposition on PPV surfaces prepared by two different synthetic routes.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 385: Symposium N – Polymer/Inorganic Interfaces II , 1995 , 117
Copyright
Copyright © Materials Research Society 1995

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References

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