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In-Situ Tem Study of Interface Sliding and Migration in an Ultrafine Lamellar Structure

Published online by Cambridge University Press:  01 February 2011

Luke L.M. Hsiung  and
T.G. Nieh
Luke L.M. Hsiung
Affiliation:
Lawrence Livermore National Laboratory, University of California L-352, P.O. Box 808 Livermore, CA 94551-9900, USA.
T.G. Nieh
Affiliation:
The University of Tennessee, Department of Materials Science and Engineering Knoxville, TN 37996-2200.
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Abstract

The stability of interfaces in an ultrafine TiAl-(y)/Ti3Al-(α2) lamellar structure by straining at room temperature has been investigated using in-situ straining techniques performed in a transmission electron microscope. The purpose of this study is to obtain experimental evidence to support the previously proposed creep mechanisms in ultrafine lamellar TiAl alloys based upon the interface sliding in association with a cooperative movement of interfacial dislocations. The results have revealed that both the sliding and migration of lamellar interfaces can take place simultaneously as a result of the cooperative motion of interfacial dislocations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 880: Symposium BB – Mechanical Properties of Nanostructured Materials-Experiments and Modeling , 2005 , BB1.9
Copyright
Copyright © Materials Research Society 2005

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